TREA

Tomohito TANIUCHI

Follow

Person

  • Nagasaki, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor inspection jig
    • Patent number 11,016,137
    • Issue date May 25, 2021
    • Mitsubishi Electric Corporation
    • Tomohito Taniuchi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor inspection jig
    • Patent number 10,895,586
    • Issue date Jan 19, 2021
    • Mitsubishi Electric Corporation
    • Tetsuya Kitagawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    INSPECTION DEVICE FOR OPTICAL SEMICONDUCTOR DEVICE
    • Publication number 20240241169
    • Publication date Jul 18, 2024
    • Mitsubishi Electric Corporation
    • Tomohito TANIUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR INSPECTION JIG
    • Publication number 20190137561
    • Publication date May 9, 2019
    • Mitsubishi Electric Corporation
    • Tomohito TANIUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR INSPECTION JIG
    • Publication number 20180164344
    • Publication date Jun 14, 2018
    • Mitsubishi Electric Corporation
    • Tetsuya KITAGAWA
    • G01 - MEASURING TESTING