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Tomoji Nakamura
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Fussa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor integrated circuit
Patent number
9,291,671
Issue date
Mar 22, 2016
Hitachi, Ltd.
Yasuyoshi Sunaga
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device
Patent number
8,037,384
Issue date
Oct 11, 2011
Hitachi, Ltd.
Takumi Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
Test method of semiconductor intergrated circuit and test pattern g...
Patent number
6,922,803
Issue date
Jul 26, 2005
Hitachi, Ltd.
Michinobu Nakao
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
Publication number
20140070863
Publication date
Mar 13, 2014
Hitachi, Ltd
Yasuyoshi Sunaga
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
Publication number
20110074385
Publication date
Mar 31, 2011
Hitachi, Ltd.
Yasuyoshi Sunaga
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20090172488
Publication date
Jul 2, 2009
Hitachi, Ltd.
Takumi Hasegawa
G01 - MEASURING TESTING
Information
Patent Application
Test method of semiconductor intergrated circuit and test pattern g...
Publication number
20020073373
Publication date
Jun 13, 2002
Michinobu Nakao
G01 - MEASURING TESTING