Tomokazu Hasegawa

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Ome-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample cooling apparatus for X-ray diffractometer and X-ray diffrac...
- Patent number 9,008,270
- Issue date Apr 14, 2015
- Rigaku Corporation
- Tomokazu Hasegawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THREE-DIMENSIONAL ELECTRON DENSITY MAP SPECIFYING APPARATUS, SYSTEM...
- Publication number 20230187017
- Publication date Jun 15, 2023
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE COOLING APPARATUS FOR X-RAY DIFFRACTOMETER AND X-RAY DIFFRAC...
- Publication number 20120275567
- Publication date Nov 1, 2012
- Rigaku Corporation
- Tomokazu Hasegawa
- G01 - MEASURING TESTING