Tomokazu Yoneda

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Ikoma-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, detection method and program
- Patent number 9,316,684
- Issue date Apr 19, 2016
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern generation for semiconductor integrated circuit
- Patent number 8,959,001
- Issue date Feb 17, 2015
- National University Corporation Nara Institute of Science and Technology
- Michiko Inoue
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE, DETECTION METHOD AND PROGRAM
- Publication number 20130013247
- Publication date Jan 10, 2013
- Kyushu Institute of Technology
- Yasuo Sato
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN GENERATION FOR SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20120283981
- Publication date Nov 8, 2012
- KYUSHU INSTITUTE OF TECHNOLOGY
- Michiko INOUE
- G01 - MEASURING TESTING