Tomoki AOYAMA

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Particle size distribution measurement device, particle analysis un...
- Patent number 12,140,519
- Issue date Nov 12, 2024
- Horiba, Ltd.
- Tetsuya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detection device, recording medium, and positioning method
- Patent number 11,940,397
- Issue date Mar 26, 2024
- Horiba, Ltd.
- Tomoki Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus and x-ray generation unit
- Patent number 11,467,107
- Issue date Oct 11, 2022
- Horiba, Ltd.
- Tomoki Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus, analyzing method, and program
- Patent number 11,293,885
- Issue date Apr 5, 2022
- Horiba, Ltd.
- Yusuke Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer, analysis system, analysis method and program
- Patent number 11,131,639
- Issue date Sep 28, 2021
- Horiba, Ltd.
- Yusuke Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus, system, analyzing method, and program
- Patent number 10,876,950
- Issue date Dec 29, 2020
- Horiba, Ltd.
- Yusuke Mizuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analyzing apparatus and calibration method
- Patent number 9,606,249
- Issue date Mar 28, 2017
- Horiba, Ltd.
- Yusuke Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus and calibration method
- Patent number 9,594,037
- Issue date Mar 14, 2017
- Horiba, Ltd.
- Yusuke Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detection apparatus for X-ray flourescence analysis
- Patent number 9,116,107
- Issue date Aug 25, 2015
- Horiba, Ltd.
- Satoru Goto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE, PARTICLE ANALYSIS UN...
- Publication number 20230168167
- Publication date Jun 1, 2023
- HORIBA, LTD.
- Tetsuya MORI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS AND X-RAY GENERATION UNIT
- Publication number 20210389262
- Publication date Dec 16, 2021
- HORIBA, LTD.
- Tomoki AOYAMA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTION DEVICE, RECORDING MEDIUM, AND POSITIONING METHOD
- Publication number 20210262953
- Publication date Aug 26, 2021
- HORIBA, LTD.
- Tomoki AOYAMA
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING APPARATUS, ANALYZING METHOD, AND PROGRAM
- Publication number 20200209173
- Publication date Jul 2, 2020
- Horiba, Ltd.
- Yusuke MIZUNO
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER, ANALYSIS SYSTEM, ANALYSIS METHOD AND PROGRAM
- Publication number 20200003711
- Publication date Jan 2, 2020
- Horiba, Ltd.
- Yusuke MIZUNO
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING APPARATUS, SYSTEM, ANALYZING METHOD, AND PROGRAM
- Publication number 20190017916
- Publication date Jan 17, 2019
- Horiba, Ltd.
- Yusuke MIZUNO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYZING APPARATUS AND CALIBRATION METHOD
- Publication number 20150338534
- Publication date Nov 26, 2015
- HORIBA, Ltd.
- Yusuke MIZUNO
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING APPARATUS AND CALIBRATION METHOD
- Publication number 20150338357
- Publication date Nov 26, 2015
- Horiba, Ltd.
- Yusuke MIZUNO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTION APPARATUS
- Publication number 20130272498
- Publication date Oct 17, 2013
- Horiba, Ltd.
- Satoru GOTO
- G01 - MEASURING TESTING

Tomoki AOYAMA

Person

Patents Grantslast 30 patents

Particle size distribution measurement device, particle analysis un...

Radiation detection device, recording medium, and positioning method

X-ray analysis apparatus and x-ray generation unit

Analyzing apparatus, analyzing method, and program

Analyzer, analysis system, analysis method and program

Analyzing apparatus, system, analyzing method, and program

Analyzing apparatus and calibration method

Analyzing apparatus and calibration method

X-ray detection apparatus for X-ray flourescence analysis

Patents Applicationslast 30 patents

PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE, PARTICLE ANALYSIS UN...

X-RAY ANALYSIS APPARATUS AND X-RAY GENERATION UNIT

RADIATION DETECTION DEVICE, RECORDING MEDIUM, AND POSITIONING METHOD

ANALYZING APPARATUS, ANALYZING METHOD, AND PROGRAM

ANALYZER, ANALYSIS SYSTEM, ANALYSIS METHOD AND PROGRAM

ANALYZING APPARATUS, SYSTEM, ANALYZING METHOD, AND PROGRAM

ANALYZING APPARATUS AND CALIBRATION METHOD

ANALYZING APPARATUS AND CALIBRATION METHOD

X-RAY DETECTION APPARATUS