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Tomoki Hikichi

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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device
    • Patent number 11,962,302
    • Issue date Apr 16, 2024
    • ABLIC Inc.
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device
    • Patent number 11,841,247
    • Issue date Dec 12, 2023
    • ABLIC Inc.
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device
    • Patent number 11,624,789
    • Issue date Apr 11, 2023
    • ABLIC INC.
    • Tomoki Hikichi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Semiconductor device
    • Patent number 11,558,052
    • Issue date Jan 17, 2023
    • ABLIC INC.
    • Tomoki Hikichi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device
    • Patent number 11,536,783
    • Issue date Dec 27, 2022
    • ABLIC INC.
    • Takaaki Hioka
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Magnetic sensor circuit
    • Patent number 11,408,946
    • Issue date Aug 9, 2022
    • ABLIC INC.
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor circuit
    • Patent number 11,293,998
    • Issue date Apr 5, 2022
    • ABLIC INC.
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device
    • Patent number 11,290,097
    • Issue date Mar 29, 2022
    • ABLIC INC.
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Stress compensation control circuit and semiconductor sensor device
    • Patent number 11,137,453
    • Issue date Oct 5, 2021
    • ABLIC INC.
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device
    • Patent number 11,131,721
    • Issue date Sep 28, 2021
    • ABLIC INC.
    • Tomoki Hikichi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Semiconductor device and method of adjusting the same
    • Patent number 11,016,151
    • Issue date May 25, 2021
    • ABLIC INC.
    • Takaaki Hioka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device
    • Patent number 10,847,710
    • Issue date Nov 24, 2020
    • ABLIC INC.
    • Takaaki Hioka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor circuit, test method for the same, and manufacturin...
    • Patent number 10,641,841
    • Issue date May 5, 2020
    • ABLIC INC.
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor circuit
    • Patent number 10,571,528
    • Issue date Feb 25, 2020
    • ABLIC INC.
    • Tomoki Hikichi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Output driver circuit
    • Patent number 10,379,565
    • Issue date Aug 13, 2019
    • ABLIC INC.
    • Masahiro Mitani
    • G05 - CONTROLLING REGULATING
  • Information Patent Grant

    Sensor circuit
    • Patent number 10,191,124
    • Issue date Jan 29, 2019
    • SII Semiconductor Corporation
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device
    • Patent number 10,110,213
    • Issue date Oct 23, 2018
    • ABLIC INC.
    • Tomoki Hikichi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Magnetic sensor
    • Patent number 9,810,746
    • Issue date Nov 7, 2017
    • SII Semiconductor Corporation
    • Kentaro Fukai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device and inspection method thereof
    • Patent number 9,726,714
    • Issue date Aug 8, 2017
    • SII SEMICONDUCTOR CORPORATION
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor circuit with power supply fluctuation detection
    • Patent number 9,638,761
    • Issue date May 2, 2017
    • SII SEMICONDUCTOR CORPORATION
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor capable of identifying an individual having a high...
    • Patent number 9,523,743
    • Issue date Dec 20, 2016
    • SII Semiconductor Corporation
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device
    • Patent number 9,453,888
    • Issue date Sep 27, 2016
    • SII SEMICONDUCTOR CORPORATION
    • Tomoki Hikichi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor device
    • Patent number 9,453,889
    • Issue date Sep 27, 2016
    • SII SEMICONDUCTOR CORPORATION
    • Takemasa Miura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor device
    • Patent number 9,267,818
    • Issue date Feb 23, 2016
    • Seiko Instruments Inc.
    • Daisuke Muraoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device
    • Patent number 9,261,569
    • Issue date Feb 16, 2016
    • Seiko Instruments Inc.
    • Minoru Ariyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device
    • Patent number 9,128,127
    • Issue date Sep 8, 2015
    • Seiko Instruments Inc.
    • Minoru Ariyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor device
    • Patent number 8,866,474
    • Issue date Oct 21, 2014
    • Seiko Instruments Inc.
    • Daisuke Muraoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic sensor device
    • Patent number 8,502,529
    • Issue date Aug 6, 2013
    • Seiko Instruments Inc.
    • Daisuke Muraoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Constant current circuit start-up circuitry for preventing power in...
    • Patent number 8,476,891
    • Issue date Jul 2, 2013
    • Seiko Instruments Inc.
    • Tomoki Hikichi
    • G05 - CONTROLLING REGULATING
  • Information Patent Grant

    Magnetic sensor circuit
    • Patent number 8,305,075
    • Issue date Nov 6, 2012
    • Seiko Instruments Inc.
    • Tomoki Hikichi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SENSOR DEVICE AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
    • Publication number 20230305083
    • Publication date Sep 28, 2023
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    VOLTAGE FLUCTUATION DETECTION CIRCUIT
    • Publication number 20230308096
    • Publication date Sep 28, 2023
    • ABLIC Inc.
    • Tomoki HIKICHI
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20220316920
    • Publication date Oct 6, 2022
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20220311425
    • Publication date Sep 29, 2022
    • ABLIC Inc.
    • Tomoki HIKICHI
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    MAGNETIC SENSOR CIRCUIT
    • Publication number 20220034979
    • Publication date Feb 3, 2022
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20210389386
    • Publication date Dec 16, 2021
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20210297070
    • Publication date Sep 23, 2021
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20210288645
    • Publication date Sep 16, 2021
    • ABLIC Inc.
    • Tomoki HIKICHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CONSTANT CURRENT CIRCUIT AND SEMICONDUCTOR DEVICE
    • Publication number 20200333820
    • Publication date Oct 22, 2020
    • ABLIC Inc.
    • Tomoki HIKICHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20200292632
    • Publication date Sep 17, 2020
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR CIRCUIT
    • Publication number 20200264241
    • Publication date Aug 20, 2020
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20200249284
    • Publication date Aug 6, 2020
    • ABLIC Inc.
    • Takaaki Hioka
    • G01 - MEASURING TESTING
  • Information Patent Application

    STRESS COMPENSATION CONTROL CIRCUIT AND SEMICONDUCTOR SENSOR DEVICE
    • Publication number 20200233045
    • Publication date Jul 23, 2020
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20190296227
    • Publication date Sep 26, 2019
    • ABLIC Inc.
    • Takaaki HIOKA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE AND METHOD OF ADJUSTING THE SAME
    • Publication number 20190285708
    • Publication date Sep 19, 2019
    • ABLIC Inc.
    • Takaaki Hioka
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MAGNETIC SENSOR CIRCUIT
    • Publication number 20180364314
    • Publication date Dec 20, 2018
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR CIRCUIT, TEST METHOD FOR THE SAME, AND MANUFACTURIN...
    • Publication number 20180267112
    • Publication date Sep 20, 2018
    • ABLIC Inc.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR CIRCUIT
    • Publication number 20180059193
    • Publication date Mar 1, 2018
    • SII Semiconductor Corporation
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20180062631
    • Publication date Mar 1, 2018
    • SII Semiconductor Corporation
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    HALL SENSOR
    • Publication number 20170199252
    • Publication date Jul 13, 2017
    • SII Semiconductor Corporation
    • Takaaki HIOKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR DEVICE AND INSPECTION METHOD THEREOF
    • Publication number 20160258995
    • Publication date Sep 8, 2016
    • SII Semiconductor Corporation
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE
    • Publication number 20150377983
    • Publication date Dec 31, 2015
    • SEIKO INSTRUMENTS INC.
    • Takemasa MIURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20150377647
    • Publication date Dec 31, 2015
    • SEIKO INSTRUMENTS INC.
    • Kentaro FUKAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20150276891
    • Publication date Oct 1, 2015
    • SEIKO INSTRUMENTS INC.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR CIRCUIT
    • Publication number 20150115942
    • Publication date Apr 30, 2015
    • SEIKO INSTRUMENTS INC.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20150084620
    • Publication date Mar 26, 2015
    • SEIKO INSTRUMENTS INC.
    • Tomoki HIKICHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20150040687
    • Publication date Feb 12, 2015
    • SEIKO INSTRUMENTS INC.
    • Minoru ARIYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OUTPUT DRIVER CIRCUIT
    • Publication number 20150035567
    • Publication date Feb 5, 2015
    • SEIKO INSTRUMENTS INC.
    • Masahiro MITANI
    • G05 - CONTROLLING REGULATING
  • Information Patent Application

    SENSOR DEVICE
    • Publication number 20150022241
    • Publication date Jan 22, 2015
    • SEIKO INSTRUMENTS INC.
    • Minoru ARIYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE
    • Publication number 20140232387
    • Publication date Aug 21, 2014
    • SEIKO INSTRUMENTS INC.
    • Daisuke MURAOKA
    • G01 - MEASURING TESTING