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Tomoki ONISHI
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Yokohama, JP
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Patents Grants
last 30 patents
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Patent Grant
Magnetic property measurement apparatus
Patent number
11,796,608
Issue date
Oct 24, 2023
Samsung Electronics Co., Ltd.
Harutaka Sekiya
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
POLARIZED MICROSCOPE AND INTRA IMAGE FIELD CORRECTION ANALYSIS METHOD
Publication number
20230305282
Publication date
Sep 28, 2023
Samsung Electronics Co., Ltd.
Ken OZAWA
G02 - OPTICS
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Patent Application
INSPECTION DEVICE
Publication number
20230125628
Publication date
Apr 27, 2023
Samsung Electronics Co., Ltd.
Shinji UEYAMA
G11 - INFORMATION STORAGE
Information
Patent Application
MAGNETIC PROPERTY MEASUREMENT APPARATUS
Publication number
20220137160
Publication date
May 5, 2022
Samsung Electronics Co., Ltd.
Harutaka SEKIYA
G01 - MEASURING TESTING