Tomoki ONISHI

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection device
- Patent number 12,327,579
- Issue date Jun 10, 2025
- Samsung Electronics Co., Ltd.
- Shinji Ueyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic property measurement apparatus
- Patent number 11,796,608
- Issue date Oct 24, 2023
- Samsung Electronics Co., Ltd.
- Harutaka Sekiya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POLARIZED MICROSCOPE AND INTRA IMAGE FIELD CORRECTION ANALYSIS METHOD
- Publication number 20230305282
- Publication date Sep 28, 2023
- Samsung Electronics Co., Ltd.
- Ken OZAWA
- G02 - OPTICS
Information Patent Application
INSPECTION DEVICE
- Publication number 20230125628
- Publication date Apr 27, 2023
- Samsung Electronics Co., Ltd.
- Shinji UEYAMA
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC PROPERTY MEASUREMENT APPARATUS
- Publication number 20220137160
- Publication date May 5, 2022
- Samsung Electronics Co., Ltd.
- Harutaka SEKIYA
- G01 - MEASURING TESTING