Tomoki SHIOTANI

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 12,169,189
- Issue date Dec 17, 2024
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system and structure evaluation method
- Patent number 11,639,880
- Issue date May 2, 2023
- Kabushiki Kaisha Toshiba
- Tomoki Shiotani
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system and structure evaluation method
- Patent number 11,181,439
- Issue date Nov 23, 2021
- Kabushiki Kaisha Toshiba
- Tomoki Shiotani
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system and structure evaluation method
- Patent number 10,883,919
- Issue date Jan 5, 2021
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation apparatus, structure evaluation system, and st...
- Patent number 10,794,990
- Issue date Oct 6, 2020
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 10,648,949
- Issue date May 12, 2020
- Kabushiki Kaisha Toshiba
- Kazuo Watabe
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 10,613,060
- Issue date Apr 7, 2020
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 10,371,666
- Issue date Aug 6, 2019
- Kabushiki Kaisha Toshiba
- Kazuo Watabe
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 10,345,275
- Issue date Jul 9, 2019
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 10,330,646
- Issue date Jun 25, 2019
- Kabushiki Kaisha Toshiba
- Kazuo Watabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20230280235
- Publication date Sep 7, 2023
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20220187253
- Publication date Jun 16, 2022
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD
- Publication number 20220034749
- Publication date Feb 3, 2022
- Kabushiki Kaisha Toshiba
- Tomoki Shiotani
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20210396715
- Publication date Dec 23, 2021
- Kabushiki Kaisha Toshiba
- Yuki UEDA
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20210181157
- Publication date Jun 17, 2021
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD
- Publication number 20190383696
- Publication date Dec 19, 2019
- KABUSHIKI KAISHA TOSHIBA
- Tomoki Shiotani
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20190317051
- Publication date Oct 17, 2019
- Kabushiki Kaisha Toshiba
- Kazuo WATABE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD
- Publication number 20180372580
- Publication date Dec 27, 2018
- KABUSHIKI KAISHA TOSHIBA
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
Structure Evaluation System, Structure Evaluation Apparatus, and St...
- Publication number 20170363586
- Publication date Dec 21, 2017
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20170363587
- Publication date Dec 21, 2017
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
Structure Evaluation System, Structure Evaluation Apparatus, and St...
- Publication number 20170336364
- Publication date Nov 23, 2017
- Kabushiki Kaisha Toshiba
- Kazuo WATABE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20170336365
- Publication date Nov 23, 2017
- Kabushiki Kaisha Toshiba
- Kazuo WATABE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION APPARATUS, STRUCTURE EVALUATION SYSTEM, AND ST...
- Publication number 20170269204
- Publication date Sep 21, 2017
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING

Tomoki SHIOTANI

Person

Patents Grantslast 30 patents

Structure evaluation system, structure evaluation apparatus, and st...

Structure evaluation system and structure evaluation method

Structure evaluation system and structure evaluation method

Structure evaluation system and structure evaluation method

Structure evaluation apparatus, structure evaluation system, and st...

Structure evaluation system, structure evaluation apparatus, and st...

Structure evaluation system, structure evaluation apparatus, and st...

Structure evaluation system, structure evaluation apparatus, and st...

Structure evaluation system, structure evaluation apparatus, and st...

Structure evaluation system, structure evaluation apparatus, and st...

Patents Applicationslast 30 patents

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD

Structure Evaluation System, Structure Evaluation Apparatus, and St...

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

Structure Evaluation System, Structure Evaluation Apparatus, and St...

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

STRUCTURE EVALUATION APPARATUS, STRUCTURE EVALUATION SYSTEM, AND ST...