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Tomoko Hirayama
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Kyoto, JP
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last 30 patents
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Patent Grant
Sample analysis tool, method for producing sample analysis tool, an...
Patent number
9,903,864
Issue date
Feb 27, 2018
ARKRAY, Inc.
Kazuhiro Ohmiya
G01 - MEASURING TESTING
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last 30 patents
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SAMPLE ANALYSIS TOOL, METHOD FOR PRODUCING SAMPLE ANALYSIS TOOL, AN...
Publication number
20120034140
Publication date
Feb 9, 2012
ARKRAY, Inc.
Kazuhiro Ohmiya
G01 - MEASURING TESTING