Tomoko Monda

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic apparatus, index calculating method, and computer progra...
- Patent number 11,162,912
- Issue date Nov 2, 2021
- KABUSHI Kl KAISHA TOSHIBA
- Tomoyuki Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor module
- Patent number 9,772,359
- Issue date Sep 26, 2017
- Kabushiki Kaisha Toshiba
- Kenji Hirohata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device
- Patent number 9,706,666
- Issue date Jul 11, 2017
- Kabushiki Kaisha Toshiba
- Tomoko Monda
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Electronic apparatus, measuring method, and monitoring apparatus
- Patent number 9,500,693
- Issue date Nov 22, 2016
- Kabushiki Kaisha Toshiba
- Tomoko Monda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Damage index predicting system and method for predicting damage-rel...
- Patent number 9,451,709
- Issue date Sep 20, 2016
- Kabushiki Kaisha Toshiba
- Tomoko Monda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electronic apparatus, a method for deciding a failure, and a method...
- Patent number 9,310,414
- Issue date Apr 12, 2016
- Kabushiki Kaisha Toshiba
- Takahiro Omori
- G01 - MEASURING TESTING
Information Patent Grant
Life predicting method for solder joint, life predicting apparatus...
- Patent number 8,965,712
- Issue date Feb 24, 2015
- Kabushiki Kaisha Toshiba
- Takahiro Omori
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor module
- Patent number 8,884,634
- Issue date Nov 11, 2014
- Kabushiki Kaisha Toshiba
- Kenji Hirohata
- G01 - MEASURING TESTING
Information Patent Grant
Electronic apparatus having circuit board
- Patent number 8,582,310
- Issue date Nov 12, 2013
- Kabushiki Kaisha Toshiba
- Tomoko Monda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electronic device
- Patent number 8,581,616
- Issue date Nov 12, 2013
- Kabushiki Kaisha Toshiba
- Tomoko Monda
- G01 - MEASURING TESTING
Information Patent Grant
Storage device and method for controlling storage device
- Patent number 8,482,998
- Issue date Jul 9, 2013
- Kabushiki Kaisha Toshiba
- Minoru Mukai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Storage device and method for controlling storage device
- Patent number 8,189,412
- Issue date May 29, 2012
- Kabushiki Kaisha Toshiba
- Minoru Mukai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electronic apparatus having self-diagnosis capability
- Patent number 8,054,640
- Issue date Nov 8, 2011
- Kabushiki Kaisha Toshiba
- Tomoko Monda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electronic apparatus
- Patent number 8,050,055
- Issue date Nov 1, 2011
- Kabushiki Kaisha Toshiba
- Tomoko Monda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electronic equipment
- Patent number 7,567,441
- Issue date Jul 28, 2009
- Kabushiki Kaisha Toshiba
- Tomoko Monda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC APPARATUS, INDEX CALCULATING METHOD, AND COMPUTER PROGRA...
- Publication number 20170074813
- Publication date Mar 16, 2017
- Kabushiki Kaisha Toshiba
- Tomoyuki SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MODULE
- Publication number 20150019150
- Publication date Jan 15, 2015
- KABUSHIKI KAISHA TOSHIBA
- Kenji HIROHATA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC APPARATUS, A METHOD FOR DECIDING A FAILURE, AND A METHOD...
- Publication number 20130257450
- Publication date Oct 3, 2013
- Takahiro OMORI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC APPARATUS, MEASURING METHOD, AND MONITORING APPARATUS
- Publication number 20130124118
- Publication date May 16, 2013
- Tomoko Monda
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MODULE
- Publication number 20120248440
- Publication date Oct 4, 2012
- Kabushiki Kaisha Toshiba
- Kenji HIROHATA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20120209537
- Publication date Aug 16, 2012
- Kabushiki Kaisha Toshiba
- Tomoko MONDA
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
STORAGE DEVICE AND METHOD FOR CONTROLLING STORAGE DEVICE
- Publication number 20120198293
- Publication date Aug 2, 2012
- Kabushiki Kaisha Toshiba
- Minoru Mukai
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
LIFE PREDICTING METHOD FOR SOLDER JOINT, LIFE PREDICTING APPARATUS...
- Publication number 20120072129
- Publication date Mar 22, 2012
- Takahiro OMORI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20120049885
- Publication date Mar 1, 2012
- Tomoko MONDA
- G01 - MEASURING TESTING
Information Patent Application
Electronic apparatus
- Publication number 20120008291
- Publication date Jan 12, 2012
- Kabushiki Kaisha Toshiba
- Tomoko Monda
- G01 - MEASURING TESTING
Information Patent Application
STORAGE DEVICE AND METHOD FOR CONTROLLING STORAGE DEVICE
- Publication number 20100082913
- Publication date Apr 1, 2010
- Kabushiki Kaisha Toshiba
- Minoru Mukai
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
DAMAGE INDEX PREDICTING SYSTEM AND METHOD FOR PREDICTING DAMAGE-REL...
- Publication number 20100070204
- Publication date Mar 18, 2010
- Kabushiki Kaisha Toshiba
- Tomoko Monda
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
ELECTRONIC APPARATUS
- Publication number 20090190317
- Publication date Jul 30, 2009
- Kabushiki Kaisha Toshiba
- Tomoko Monda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ELECTRONIC APPARATUS
- Publication number 20080310130
- Publication date Dec 18, 2008
- Tomoko Monda
- G01 - MEASURING TESTING
Information Patent Application
Electronic equipment
- Publication number 20080068814
- Publication date Mar 20, 2008
- Kabushiki Kaisha Toshiba
- Tomoko Monda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Tomoko Monda

Person

Patents Grantslast 30 patents

Electronic apparatus, index calculating method, and computer progra...

Semiconductor module

Electronic device

Electronic apparatus, measuring method, and monitoring apparatus

Damage index predicting system and method for predicting damage-rel...

Electronic apparatus, a method for deciding a failure, and a method...

Life predicting method for solder joint, life predicting apparatus...

Semiconductor module

Electronic apparatus having circuit board

Electronic device

Storage device and method for controlling storage device

Storage device and method for controlling storage device

Electronic apparatus having self-diagnosis capability

Electronic apparatus

Electronic equipment

Patents Applicationslast 30 patents

ELECTRONIC APPARATUS, INDEX CALCULATING METHOD, AND COMPUTER PROGRA...

SEMICONDUCTOR MODULE

ELECTRONIC APPARATUS, A METHOD FOR DECIDING A FAILURE, AND A METHOD...

ELECTRONIC APPARATUS, MEASURING METHOD, AND MONITORING APPARATUS

SEMICONDUCTOR MODULE

ELECTRONIC DEVICE

STORAGE DEVICE AND METHOD FOR CONTROLLING STORAGE DEVICE

LIFE PREDICTING METHOD FOR SOLDER JOINT, LIFE PREDICTING APPARATUS...

ELECTRONIC DEVICE

Electronic apparatus

STORAGE DEVICE AND METHOD FOR CONTROLLING STORAGE DEVICE

DAMAGE INDEX PREDICTING SYSTEM AND METHOD FOR PREDICTING DAMAGE-REL...

ELECTRONIC APPARATUS

ELECTRONIC APPARATUS

Electronic equipment