Tomoko MORIOKA

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Kanagawa-ken, JP

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Patents Grantslast 30 patents

Information Patent Grant
Ultrasonic inspection device and method of ultrasonic inspection
- Patent number 9,714,924
- Issue date Jul 25, 2017
- Kabushiki Kaisha Toshiba
- Tomoko Morioka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor light emitting device and method for manufacturing th...
- Patent number 8,877,526
- Issue date Nov 4, 2014
- Kabushiki Kaisha Toshiba
- Hiroshi Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor light emitting device and method for manufacturing se...
- Patent number 8,546,178
- Issue date Oct 1, 2013
- Kabushiki Kaisha Toshiba
- Tomoko Morioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor light emitting device and method for manufacturing th...
- Patent number 8,461,611
- Issue date Jun 11, 2013
- Kabushiki Kaisha Toshiba
- Hiroshi Ono
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ULTRASONIC INSPECTION DEVICE AND METHOD OF ULTRASONIC INSPECTION
- Publication number 20140283610
- Publication date Sep 25, 2014
- KABUSHIKI KAISHA TOSHIBA
- Tomoko MORIOKA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR LIGHT EMITTING DEVICE AND METHOD FOR MANUFACTURING TH...
- Publication number 20130203192
- Publication date Aug 8, 2013
- KABUSHIKI KAISHA TOSHIBA
- Hiroshi ONO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR LIGHT EMITTING DEVICE AND METHOD FOR MANUFACTURING TH...
- Publication number 20120138985
- Publication date Jun 7, 2012
- Kabushiki Kaisha Toshiba
- Hiroshi ONO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR LIGHT EMITTING DEVICE AND METHOD FOR MANUFACTURING SE...
- Publication number 20120012874
- Publication date Jan 19, 2012
- Kabushiki Kaisha Toshiba
- Tomoko MORIOKA
- H01 - BASIC ELECTRIC ELEMENTS