Tomoko Nobekawa

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing semiconductor integrated circuit and method for...
- Patent number 7,765,446
- Issue date Jul 27, 2010
- Panasonic Corporation
- Tomoko Nobekawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing semiconductor integrated circuit and method for...
- Patent number 7,543,206
- Issue date Jun 2, 2009
- Panasonic Corporation
- Tomoko Nobekawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 7,498,967
- Issue date Mar 3, 2009
- Panasonic Corporation
- Masaya Hirose
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR...
- Publication number 20090265593
- Publication date Oct 22, 2009
- PANASONIC CORPORATION
- Tomoko Nobekawa
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device
- Publication number 20080007440
- Publication date Jan 10, 2008
- Masaya Hirose
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method for testing semiconductor integrated circuit and method for...
- Publication number 20070136629
- Publication date Jun 14, 2007
- Tomoko Nobekawa
- G01 - MEASURING TESTING