Tomoko Seko

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Kyoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical analyzer
- Patent number 11,561,171
- Issue date Jan 24, 2023
- HORIBA ADVANCED TECHNO, CO., LTD.
- Takuya Onoda
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Reference electrode
- Patent number 10,914,707
- Issue date Feb 9, 2021
- Horiba, Ltd.
- Kazuhiro Miyamura
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement cell, optical analyzer, and manufacturing metho...
- Patent number 10,718,705
- Issue date Jul 21, 2020
- HORIBA Advanced Techno, Co., Ltd.
- Tatsuya Nakahara
- G01 - MEASURING TESTING
Information Patent Grant
Thermal conductivity sensor
- Patent number 8,302,459
- Issue date Nov 6, 2012
- HORIBA, Ltd.
- Makoto Matsuhama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL ANALYZER
- Publication number 20200333248
- Publication date Oct 22, 2020
- HORIBA ADVANCED TECHNO, CO., LTD.
- Takuya ONODA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
OPTICAL MEASUREMENT CELL, OPTICAL ANALYZER, AND MANUFACTURING METHO...
- Publication number 20190271637
- Publication date Sep 5, 2019
- HORIBA Advanced Techno, Co., Ltd.
- Tatsuya Nakahara
- G01 - MEASURING TESTING
Information Patent Application
GAS CONCENTRATION MEASUREMENT APPARATUS
- Publication number 20180003626
- Publication date Jan 4, 2018
- HORIBA, Ltd.
- Kimihiko ARIMOTO
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE ELECTRODE
- Publication number 20170191960
- Publication date Jul 6, 2017
- HORIBA, LTD.
- Kazuhiro Miyamura
- G01 - MEASURING TESTING
Information Patent Application
THERMAL CONDUCTIVITY SENSOR
- Publication number 20100242573
- Publication date Sep 30, 2010
- HORIBA LTD.
- Makoto Matsuhama
- G01 - MEASURING TESTING