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Osaka, JP
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Patents Grants
last 30 patents
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Patent Grant
Proton-conducting structure and method for manufacturing the same
Patent number
8,518,595
Issue date
Aug 27, 2013
Panasonic Corporation
Yuji Zenitani
G01 - MEASURING TESTING
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Patent Grant
Proton-conducting structure and method for manufacturing the same
Patent number
8,298,718
Issue date
Oct 30, 2012
Panasonic Corporation
Yuji Zenitani
G01 - MEASURING TESTING
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Patent Grant
Proton-conducting structure and method for manufacturing the same
Patent number
8,029,941
Issue date
Oct 4, 2011
Panasonic Corporation
Yuji Zenitani
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
PROTON-CONDUCTING STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
Publication number
20130071766
Publication date
Mar 21, 2013
Yuji ZENITANI
G01 - MEASURING TESTING
Information
Patent Application
PROTON-CONDUCTING STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
Publication number
20110305963
Publication date
Dec 15, 2011
Yuji ZENITANI
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
PROTON-CONDUCTING STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
Publication number
20110053044
Publication date
Mar 3, 2011
PANASONIC CORPORATION
Yuji Zenitani
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...