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Tomomi NISHIMURA
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Kyoto, JP
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last 30 patents
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Patent Grant
Analysis device and separation device
Patent number
10,766,040
Issue date
Sep 8, 2020
AFI Corporation
Yoshikazu Wakizaka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
ANALYSIS DEVICE AND SEPARATION DEVICE
Publication number
20190032103
Publication date
Jan 31, 2019
AFI Corporation
Yoshikazu WAKIZAKA
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL