Tomomi Sugiyama

Person

Kobe-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample processing apparatus
- Patent number RE49503
- Issue date Apr 25, 2023
- Sysmex Corporation
- Keisuke Kuwano
Information Patent Grant
Method and system for aggregating diagnostic analyzer related infor...
- Patent number 11,315,084
- Issue date Apr 26, 2022
- Sysmex Corporation
- Judy Bosko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample processing apparatus
- Patent number RE48189
- Issue date Sep 1, 2020
- Sysmex Corporation
- Keisuke Kuwano
Information Patent Grant
Method and system for aggregating diagnostic analyzer related infor...
- Patent number 10,447,573
- Issue date Oct 15, 2019
- SYSMEX CORPORATION
- Judy Bosko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample processing apparatus
- Patent number 8,706,303
- Issue date Apr 22, 2014
- Sysmex Corporation
- Keisuke Kuwano
- G01 - MEASURING TESTING
Information Patent Grant
Control device and analyzer
- Patent number 8,065,113
- Issue date Nov 22, 2011
- Sysmex Corporation
- Ken′ichi Okuno
- G01 - MEASURING TESTING
Information Patent Grant
Clinical laboratory management systems, management apparatuses, and...
- Patent number 7,754,149
- Issue date Jul 13, 2010
- Sysmex Corporation
- Tomomi Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control device and analyzer
- Patent number 7,725,297
- Issue date May 25, 2010
- Sysmex Corporation
- Ken′ichi Okuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control device and analyzer
- Patent number 7,606,680
- Issue date Oct 20, 2009
- Sysmex Corporation
- Ken′ichi Okuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control device and analyzer
- Patent number 7,403,873
- Issue date Jul 22, 2008
- Sysmex Corporation
- Ken′ichi Okuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quality control and support method for analyzer
- Patent number 6,937,964
- Issue date Aug 30, 2005
- Sysmex Corporation
- Ken′ichi Okuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Support method, quality control method, and device therefor
- Patent number 6,629,060
- Issue date Sep 30, 2003
- Sysmex Corporation
- Ken′ichi Okuno
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR AGGREGATING DIAGNOSTIC ANALYZER RELATED INFOR...
- Publication number 20250013992
- Publication date Jan 9, 2025
- SYSMEX CORPORATION
- Judy Bosko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR AGGREGATING DIAGNOSTIC ANALYZER RELATED INFOR...
- Publication number 20220253812
- Publication date Aug 11, 2022
- SYSMEX CORPORATION
- Judy Bosko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR AGGREGATING DIAGNOSTIC ANALYZER RELATED INFOR...
- Publication number 20190394114
- Publication date Dec 26, 2019
- Sysmex Corporation
- Judy Bosko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND SYSTEM FOR AGGREGATING DIAGNOSTIC ANALYZER RELATED INFOR...
- Publication number 20160020986
- Publication date Jan 21, 2016
- SYSMEX CORPORATION
- Judy Bosko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SAMPLE PROCESSING APPARATUS
- Publication number 20120282155
- Publication date Nov 8, 2012
- Keisuke Kuwano
- G01 - MEASURING TESTING
Information Patent Application
CONTROL DEVICE AND ANALYZER
- Publication number 20100127885
- Publication date May 27, 2010
- Sysmex Corporation
- Ken'ichi Okuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL DEVICE AND ANALYZER
- Publication number 20100057873
- Publication date Mar 4, 2010
- Sysmex Corporation
- Ken'ichi Okuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Control Device and Analyzer
- Publication number 20080046208
- Publication date Feb 21, 2008
- SYSMEX CORPORATION
- Ken'ichi Okuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Control Device and Analyzer
- Publication number 20080046503
- Publication date Feb 21, 2008
- SYSMEX CORPORATION
- Ken'ichi Okuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Control device and analyzer
- Publication number 20050177345
- Publication date Aug 11, 2005
- SYSMEX CORPORATION
- Ken'ichi Okuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Clinical laboratory management systems, management apparatuses, and...
- Publication number 20050131734
- Publication date Jun 16, 2005
- Tomomi Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Quality control and support method for analyzer
- Publication number 20040019460
- Publication date Jan 29, 2004
- Ken?apos;ichi Okuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Support method, quality control method, and device therefor
- Publication number 20020128801
- Publication date Sep 12, 2002
- Ken?apos;ichi Okuno
- G01 - MEASURING TESTING

Tomomi Sugiyama

Person

Patents Grantslast 30 patents

Sample processing apparatus

Method and system for aggregating diagnostic analyzer related infor...

Sample processing apparatus

Method and system for aggregating diagnostic analyzer related infor...

Sample processing apparatus

Control device and analyzer

Clinical laboratory management systems, management apparatuses, and...

Control device and analyzer

Control device and analyzer

Control device and analyzer

Quality control and support method for analyzer

Support method, quality control method, and device therefor

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR AGGREGATING DIAGNOSTIC ANALYZER RELATED INFOR...

METHOD AND SYSTEM FOR AGGREGATING DIAGNOSTIC ANALYZER RELATED INFOR...

METHOD AND SYSTEM FOR AGGREGATING DIAGNOSTIC ANALYZER RELATED INFOR...

METHOD AND SYSTEM FOR AGGREGATING DIAGNOSTIC ANALYZER RELATED INFOR...

SAMPLE PROCESSING APPARATUS

CONTROL DEVICE AND ANALYZER

CONTROL DEVICE AND ANALYZER

Control Device and Analyzer

Control Device and Analyzer

Control device and analyzer

Clinical laboratory management systems, management apparatuses, and...

Quality control and support method for analyzer

Support method, quality control method, and device therefor