Tomomi Tamura

Person

  • Kyoto, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Mass spectrometer, sampling probe, and analysis method

    • Patent number 10,930,488
    • Issue date Feb 23, 2021
    • Shimadzu Corporation
    • Osamu Furuhashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    X-ray generator

    • Patent number 9,589,760
    • Issue date Mar 7, 2017
    • Shimadzu Corporation
    • Akihiro Miyaoka
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    X-ray generating apparatus

    • Patent number 8,213,575
    • Issue date Jul 3, 2012
    • Shimadzu Corporation
    • Tomomi Tamura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    X-ray generator

    • Patent number 7,340,036
    • Issue date Mar 4, 2008
    • Shimadzu Corporation
    • Sadamu Tomita
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE

    • Publication number 20210042943
    • Publication date Feb 11, 2021
    • Shimadzu Corporation
    • Ryuta MATSUMOTO
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    MASS SPECTROMETER, SAMPLING PROBE, AND ANALYSIS METHOD

    • Publication number 20200328071
    • Publication date Oct 15, 2020
    • Shimadzu Corporation
    • Osamu FURUHASHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    X-RAY GENERATOR

    • Publication number 20150103979
    • Publication date Apr 16, 2015
    • Shimadzu Corporation
    • Akihiro MIYAOKA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    X-RAY GENERATING APPARATUS

    • Publication number 20100067664
    • Publication date Mar 18, 2010
    • Tomomi Tamura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    X-ray generator

    • Publication number 20070258565
    • Publication date Nov 8, 2007
    • Shimadzu Corporation
    • Sadamu Tomita
    • H01 - BASIC ELECTRIC ELEMENTS