Tomonobu Nakayama

Person

Saitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Double-side-coated surface stress sensor
- Patent number 9,506,822
- Issue date Nov 29, 2016
- National Institute for Materials Science
- Genki Yoshikawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical electric field enhancement element and probe using the same
- Patent number 8,601,610
- Issue date Dec 3, 2013
- Japan Science and Technology Agency
- Yoshitaka Shingaya
- G01 - MEASURING TESTING
Information Patent Grant
Surface enhanced infrared absorption sensor and method for producin...
- Patent number 8,193,499
- Issue date Jun 5, 2012
- National Institute for Materials Science
- Tadaaki Nagao
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and a method to measure relative-position...
- Patent number 8,141,168
- Issue date Mar 20, 2012
- National Institute for Materials Science
- Tomonobu Nakayama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electric device using solid electrolyte
- Patent number 7,875,883
- Issue date Jan 25, 2011
- Japan Science and Technology Agency
- Toshitsugu Sakamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Solid electrolyte switching device, FPGA using same, memory device,...
- Patent number 7,750,332
- Issue date Jul 6, 2010
- Japan Science and Technology Agency
- Toshitsugu Sakamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Point contact array, not circuit, and electronic circuit using the...
- Patent number 7,525,410
- Issue date Apr 28, 2009
- Japan Science and Technology Agency
- Masakazu Aono
- G11 - INFORMATION STORAGE
Information Patent Grant
Point contact array, not circuit, and electronic circuit comprising...
- Patent number 7,473,982
- Issue date Jan 6, 2009
- Japan Science and Technology Agency
- Masakazu Aono
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning probe microscope and specimen surface structure measuring...
- Patent number 7,241,994
- Issue date Jul 10, 2007
- Riken
- Tsuyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Point contact array, not circuit, and electronic circuit comprising...
- Patent number 7,026,911
- Issue date Apr 11, 2006
- Japan Science and Technology Corporation
- Masakazu Aono
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic device having controllable conductance
- Patent number 6,891,186
- Issue date May 10, 2005
- Japan Science and Technology Corporation
- Masakazu Aono
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for evaluating electrical characteristics
- Patent number 6,833,719
- Issue date Dec 21, 2004
- Japan Science and Technology Corporation
- Tsuyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling microscope, its probe, processing method for the...
- Patent number 6,608,306
- Issue date Aug 19, 2003
- Japan Science and Technology Corporation
- Masakazu Aono
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting magnetic shield
- Patent number 5,418,512
- Issue date May 23, 1995
- Mitsui Kinzoku Kogyo Kabushiki Shisha
- Hiroshi Ohta
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Superconducting magnetic shield
- Patent number 5,187,327
- Issue date Feb 16, 1993
- Mitsui Kinzoku Kogyo Kabushiki Kaisha
- Hiroshi Ohta
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
DOUBLE-SIDE-COATED SURFACE STRESS SENSOR
- Publication number 20140352447
- Publication date Dec 4, 2014
- NATIONAL INSTITUTE FOR MATERIALS SCIENCE
- Genki Yoshikawa
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELECTRIC FIELD ENHANCEMENT ELEMENT AND PROBE USING THE SAME
- Publication number 20100281587
- Publication date Nov 4, 2010
- Yoshitaka Shingaya
- G01 - MEASURING TESTING
Information Patent Application
SURFACE ENHANCED INFRARED ABSORPTION SENSOR AND METHOD FOR PRODUCIN...
- Publication number 20100239821
- Publication date Sep 23, 2010
- Tadaaki Nagao
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND A METHOD TO MEASURE RELATIVE POSITION...
- Publication number 20100005552
- Publication date Jan 7, 2010
- Tomonobu Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and specimen surface structure measuring...
- Publication number 20050242283
- Publication date Nov 3, 2005
- Tsuyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Point contact array, not circuit, and electronic circuit using the...
- Publication number 20050243844
- Publication date Nov 3, 2005
- Japan Science and Technology Corporation
- Masakazu Aono
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Solid electrolyte switching device, fpga using same, memory device,...
- Publication number 20050127524
- Publication date Jun 16, 2005
- Toshitsugu Sakamoto
- G11 - INFORMATION STORAGE
Information Patent Application
Point contact array, not circuit, and electronic circuit comprising...
- Publication number 20050014325
- Publication date Jan 20, 2005
- Japan Science and Technology Corporation
- Masakazu Aono
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Electronic device having controllable conductance
- Publication number 20040089882
- Publication date May 13, 2004
- Masakazu Aono
- G11 - INFORMATION STORAGE
Information Patent Application
Point contact array, not circuit, and electronic circuit comprising...
- Publication number 20030174042
- Publication date Sep 18, 2003
- Masakazu Aono
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Apparatus for evaluating electrical characteristics
- Publication number 20020178800
- Publication date Dec 5, 2002
- Tsuyoshi Hasegawa
- B82 - NANO-TECHNOLOGY

Tomonobu Nakayama

Person

Patents Grantslast 30 patents

Double-side-coated surface stress sensor

Optical electric field enhancement element and probe using the same

Surface enhanced infrared absorption sensor and method for producin...

Scanning probe microscope and a method to measure relative-position...

Electric device using solid electrolyte

Solid electrolyte switching device, FPGA using same, memory device,...

Point contact array, not circuit, and electronic circuit using the...

Point contact array, not circuit, and electronic circuit comprising...

Scanning probe microscope and specimen surface structure measuring...

Point contact array, not circuit, and electronic circuit comprising...

Electronic device having controllable conductance

Apparatus for evaluating electrical characteristics

Scanning tunneling microscope, its probe, processing method for the...

Superconducting magnetic shield

Superconducting magnetic shield

Patents Applicationslast 30 patents

DOUBLE-SIDE-COATED SURFACE STRESS SENSOR

OPTICAL ELECTRIC FIELD ENHANCEMENT ELEMENT AND PROBE USING THE SAME

SURFACE ENHANCED INFRARED ABSORPTION SENSOR AND METHOD FOR PRODUCIN...

SCANNING PROBE MICROSCOPE AND A METHOD TO MEASURE RELATIVE POSITION...

Scanning probe microscope and specimen surface structure measuring...

Point contact array, not circuit, and electronic circuit using the...

Solid electrolyte switching device, fpga using same, memory device,...

Point contact array, not circuit, and electronic circuit comprising...

Electronic device having controllable conductance

Point contact array, not circuit, and electronic circuit comprising...

Apparatus for evaluating electrical characteristics