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Tomonori Honjou
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Kawasaki, JP
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor device and semiconductor integrated circuit
Patent number
6,909,649
Issue date
Jun 21, 2005
Fujitsu Limited
Tomonori Honjou
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Semiconductor device and semiconductor integrated circuit
Publication number
20040015807
Publication date
Jan 22, 2004
FUJITSU LIMITED
Tomonori Honjou
G01 - MEASURING TESTING