Tomonori KONDO

Person

Fukuchiyama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical measurement device and optical measurement method
- Patent number 11,194,047
- Issue date Dec 7, 2021
- Omron Corporation
- Yosuke Kajii
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus having a synchronizing function of sy...
- Patent number 10,514,294
- Issue date Dec 24, 2019
- Omron Corporation
- Yoshihiro Kanetani
- G05 - CONTROLLING REGULATING
Information Patent Grant
Optical sensor and abnormality detection method for optical sensor
- Patent number 10,514,460
- Issue date Dec 24, 2019
- Omron Corporation
- Norihiro Tomago
- G02 - OPTICS
Information Patent Grant
Displacement measuring device, measuring system and displacement me...
- Patent number 10,495,448
- Issue date Dec 3, 2019
- Omron Corporation
- Tomonori Kondo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Displacement measurement device, measurement system, and displaceme...
- Patent number 10,444,360
- Issue date Oct 15, 2019
- Omron Corporation
- Tomonori Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device
- Patent number 10,254,108
- Issue date Apr 9, 2019
- Omron Corporation
- Koji Shimada
- G05 - CONTROLLING REGULATING
Information Patent Grant
Optical displacement sensor and system including the same
- Patent number 10,168,422
- Issue date Jan 1, 2019
- Omron Corporation
- Tomonori Kondo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
- Publication number 20190219695
- Publication date Jul 18, 2019
- Omron Corporation
- Yosuke KAJII
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR AND ABNORMALITY DETECTION METHOD FOR OPTICAL SENSOR
- Publication number 20190101646
- Publication date Apr 4, 2019
- Omron Corporation
- Norihiro TOMAGO
- G02 - OPTICS
Information Patent Application
DISPLACEMENT MEASURING DEVICE, MEASURING SYSTEM AND DISPLACEMENT ME...
- Publication number 20190094013
- Publication date Mar 28, 2019
- Omron Corporation
- Tomonori KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLACEMENT MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND DISPLACEME...
- Publication number 20190094368
- Publication date Mar 28, 2019
- Omron Corporation
- Tomonori KONDO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISPLACEMENT SENSOR AND SYSTEM INCLUDING THE SAME
- Publication number 20180239003
- Publication date Aug 23, 2018
- Omron Corporation
- Tomonori KONDO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS
- Publication number 20180010962
- Publication date Jan 11, 2018
- Omron Corporation
- Yoshihiro KANETANI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE
- Publication number 20170276474
- Publication date Sep 28, 2017
- Omron Corporation
- Koji SHIMADA
- G01 - MEASURING TESTING

Tomonori KONDO

Person

Patents Grantslast 30 patents

Optical measurement device and optical measurement method

Optical measurement apparatus having a synchronizing function of sy...

Optical sensor and abnormality detection method for optical sensor

Displacement measuring device, measuring system and displacement me...

Displacement measurement device, measurement system, and displaceme...

Optical measurement device

Optical displacement sensor and system including the same

Patents Applicationslast 30 patents

OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD

OPTICAL SENSOR AND ABNORMALITY DETECTION METHOD FOR OPTICAL SENSOR

DISPLACEMENT MEASURING DEVICE, MEASURING SYSTEM AND DISPLACEMENT ME...

DISPLACEMENT MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND DISPLACEME...

OPTICAL DISPLACEMENT SENSOR AND SYSTEM INCLUDING THE SAME

OPTICAL MEASUREMENT APPARATUS

OPTICAL MEASUREMENT DEVICE