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Tomonori Mimura

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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20180128741
    • Publication date May 10, 2018
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC TRANSACTION DEVICE AND PROGRAM THEREOF
    • Publication number 20170116586
    • Publication date Apr 27, 2017
    • Oki Electric Industry Co., Ltd.
    • Tomonori MIMURA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150219680
    • Publication date Aug 6, 2015
    • Hitachi High-Technologies Corporation
    • Tomonori Mimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150198525
    • Publication date Jul 16, 2015
    • Hitachi High-Technologies Corporation
    • Sakuichiro Adachi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150185242
    • Publication date Jul 2, 2015
    • Tomonori Mimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Apparatus and Sample Measuring Method
    • Publication number 20150160251
    • Publication date Jun 11, 2015
    • Hitachi High-Technologies Corporation
    • Akiko Yokokawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140377853
    • Publication date Dec 25, 2014
    • Sakuichiro Adachi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER AND ANALYZING METHOD
    • Publication number 20140220705
    • Publication date Aug 7, 2014
    • Hitachi High-Technologies Corporation
    • Takeshi Yogi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND METHOD FOR DETERMINING MALFUNCTION THEREOF
    • Publication number 20140190253
    • Publication date Jul 10, 2014
    • Hitachi High-Technologies Corporation
    • Masaharu Nishida
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
    • Publication number 20140147348
    • Publication date May 29, 2014
    • Hitachi High-Technologies Corporation
    • Hajime KATOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20140140890
    • Publication date May 22, 2014
    • Hitachi High-Technologies Corporation
    • Sakuichiro Adachi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS PROGRAM
    • Publication number 20140136123
    • Publication date May 15, 2014
    • Hitachi High-Technologies Corporation
    • Chihiro Manri
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20130266484
    • Publication date Oct 10, 2013
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER, ANALYSIS METHOD, AND INFORMATION PROCESSOR
    • Publication number 20130122596
    • Publication date May 16, 2013
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20130046480
    • Publication date Feb 21, 2013
    • Chihiro Manri
    • G01 - MEASURING TESTING
  • Information Patent Application

    BLOOD COAGULATION ANALYZER
    • Publication number 20120282139
    • Publication date Nov 8, 2012
    • Hitachi High-Technologies Corporation
    • Akihisa Makino
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROLYTE ANALYZER
    • Publication number 20120261260
    • Publication date Oct 18, 2012
    • Hitachi High-Technologies Corporation
    • Qing Li
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20120141330
    • Publication date Jun 7, 2012
    • Sakuichiro Adachi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND ANALYSIS METHOD
    • Publication number 20120109534
    • Publication date May 3, 2012
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20120065898
    • Publication date Mar 15, 2012
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND ANALYSIS METHOD
    • Publication number 20120064636
    • Publication date Mar 15, 2012
    • Hitachi High-Technologies Corporation
    • Satoshi Mitsuyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS APPARATUS
    • Publication number 20120048036
    • Publication date Mar 1, 2012
    • Hitachi High-Technologies Corporation
    • Tomonori Mimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS APPARATUS
    • Publication number 20120039748
    • Publication date Feb 16, 2012
    • Hitachi High-Technologies Corporation
    • Tomonori Mimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND DISPENSING DEVICE
    • Publication number 20120020838
    • Publication date Jan 26, 2012
    • Hitachi High-Technologies Corporation
    • Tomonori Mimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    ACCURACY MANAGEMENT METHOD
    • Publication number 20120000268
    • Publication date Jan 5, 2012
    • Qing Li
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20110301917
    • Publication date Dec 8, 2011
    • Hitachi High-Technologies Corporation
    • Kumiko Kamihara
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    METHOD FOR ASSISTING JUDGMENT OF ABNORMALITY OF REACTION PROCESS DA...
    • Publication number 20110125415
    • Publication date May 26, 2011
    • Satoshi Mitsuyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20110104810
    • Publication date May 5, 2011
    • Hitachi High-Technologies Corporation
    • Masaki Shiba
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
    • Publication number 20100233027
    • Publication date Sep 16, 2010
    • Hajime Katou
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20090263281
    • Publication date Oct 22, 2009
    • Hitachi High-Technologies Corporation
    • Emiko Ushiku
    • G01 - MEASURING TESTING