Tomonori Nakamura

Person

Hamamatsu, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Solid immersion lens unit and semiconductor inspection device
- Patent number 12,235,433
- Issue date Feb 25, 2025
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G02 - OPTICS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,228,515
- Issue date Feb 18, 2025
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device inspection method and semiconductor device ins...
- Patent number 12,222,387
- Issue date Feb 11, 2025
- Hamamatsu Photonics K.K.
- Norimichi Chinone
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus comprising a first imager imaging fluorescence...
- Patent number 12,072,289
- Issue date Aug 27, 2024
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,013,349
- Issue date Jun 18, 2024
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Cooling unit, objective lens module, semiconductor inspection devic...
- Patent number 11,841,393
- Issue date Dec 12, 2023
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection device
- Patent number 11,714,120
- Issue date Aug 1, 2023
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,694,324
- Issue date Jul 4, 2023
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device analysis apparatus and device analysis method
- Patent number 11,460,497
- Issue date Oct 4, 2022
- Hamamatsu Photonics K.K.
- Toru Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Carrier lifespan measurement method and carrier lifespan measuremen...
- Patent number 11,415,525
- Issue date Aug 16, 2022
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device, observing device and measuring method
- Patent number 11,402,200
- Issue date Aug 2, 2022
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Concentration measurement method and concentration measurement device
- Patent number 11,280,776
- Issue date Mar 22, 2022
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G02 - OPTICS
Information Patent Grant
Solid immersion lens unit and semiconductor detector device
- Patent number 11,256,079
- Issue date Feb 22, 2022
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G02 - OPTICS
Information Patent Grant
Semiconductor inspection device
- Patent number 11,209,476
- Issue date Dec 28, 2021
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device inspection method and semiconductor device ins...
- Patent number 11,047,792
- Issue date Jun 29, 2021
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Image generating method, image generating device, image generating...
- Patent number 11,009,531
- Issue date May 18, 2021
- Hamamatsu Photonics K.K.
- Akihiro Otaka
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 10,976,284
- Issue date Apr 13, 2021
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G02 - OPTICS
Information Patent Grant
Semiconductor device inspection device and semiconductor device ins...
- Patent number 10,705,139
- Issue date Jul 7, 2020
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 10,698,006
- Issue date Jun 30, 2020
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Optical device for microscopic observation
- Patent number 10,663,709
- Issue date May 26, 2020
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G02 - OPTICS
Information Patent Grant
Image generating method, image generating device, image generating...
- Patent number 10,656,187
- Issue date May 19, 2020
- Hamamatsu Photonics K.K.
- Akihiro Otaka
- G01 - MEASURING TESTING
Information Patent Grant
Analysis system and analysis method
- Patent number 10,591,427
- Issue date Mar 17, 2020
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Optical polarization inspection device and method
- Patent number 10,564,126
- Issue date Feb 18, 2020
- HAMAMATSU PHOTONICS K.K.
- Tomonori Nakamura
- G02 - OPTICS
Information Patent Grant
System for testing integrated circuit and method for testing integr...
- Patent number 10,508,996
- Issue date Dec 17, 2019
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light source device and inspection device
- Patent number 10,408,874
- Issue date Sep 10, 2019
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heat generation point detection method and heat generation point de...
- Patent number 10,371,746
- Issue date Aug 6, 2019
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Analysis system and analysis method
- Patent number 10,365,324
- Issue date Jul 30, 2019
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Analysis system and analysis method
- Patent number 10,330,615
- Issue date Jun 25, 2019
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspection device and semiconductor device ins...
- Patent number 10,191,104
- Issue date Jan 29, 2019
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image generation apparatus and image generation method
- Patent number 10,139,447
- Issue date Nov 27, 2018
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...
- Publication number 20240361382
- Publication date Oct 31, 2024
- Hamamatsu Photonics K.K.
- Masataka IKESU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240361244
- Publication date Oct 31, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240302292
- Publication date Sep 12, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD, INSPECTION METHOD, AND INSPECTION DEVICE
- Publication number 20240178073
- Publication date May 30, 2024
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION METHOD, CONDUCTIVE MEMBER, AND INSPECTION DEVICE
- Publication number 20240168080
- Publication date May 23, 2024
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
- Publication number 20240125589
- Publication date Apr 18, 2024
- Hamamatsu Photonics K.K.
- Kenichi OHTSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE
- Publication number 20240012047
- Publication date Jan 11, 2024
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASUREMENT DEVICE
- Publication number 20230324550
- Publication date Oct 12, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE DEVICE AND DISTANCE MEASUREMENT DEVICE
- Publication number 20230324520
- Publication date Oct 12, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230289950
- Publication date Sep 14, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...
- Publication number 20230184827
- Publication date Jun 15, 2023
- Hamamatsu Photonics K.K.
- Norimichi CHINONE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...
- Publication number 20230184825
- Publication date Jun 15, 2023
- Hamamatsu Photonics K.K.
- Norimichi CHINONE
- G01 - MEASURING TESTING
Information Patent Application
IMAGING UNIT AND MEASUREMENT DEVICE
- Publication number 20230061667
- Publication date Mar 2, 2023
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
HEIGHT MEASUREMENT APPARATUS AND HEIGHT MEASUREMENT METHOD
- Publication number 20230066638
- Publication date Mar 2, 2023
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
- Publication number 20230058064
- Publication date Feb 23, 2023
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20220373480
- Publication date Nov 24, 2022
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
SOLID IMMERSION LENS UNIT AND SEMICONDUCTOR INSPECTION DEVICE
- Publication number 20220326501
- Publication date Oct 13, 2022
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G02 - OPTICS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20220198644
- Publication date Jun 23, 2022
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20220196551
- Publication date Jun 23, 2022
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20220178837
- Publication date Jun 9, 2022
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
COOLING UNIT, OBJECTIVE LENS MODULE, SEMICONDUCTOR INSPECTION DEVIC...
- Publication number 20220091182
- Publication date Mar 24, 2022
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE
- Publication number 20220050137
- Publication date Feb 17, 2022
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE
- Publication number 20210333207
- Publication date Oct 28, 2021
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
CONCENTRATION MEASUREMENT METHOD AND CONCENTRATION MEASUREMENT DEVICE
- Publication number 20200408730
- Publication date Dec 31, 2020
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
CARRIER LIFESPAN MEASUREMENT METHOD AND CARRIER LIFESPAN MEASUREMEN...
- Publication number 20200408701
- Publication date Dec 31, 2020
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PRODUCTION METHOD AND WAFER INSPECTION METHOD
- Publication number 20200258794
- Publication date Aug 13, 2020
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL DEVICE FOR MICROSCOPIC OBSERVATION
- Publication number 20200241275
- Publication date Jul 30, 2020
- HAMAMATSU PHOTONICS K. K.
- Tomonori Nakamura
- G02 - OPTICS
Information Patent Application
IMAGE GENERATING METHOD, IMAGE GENERATING DEVICE, IMAGE GENERATING...
- Publication number 20200241054
- Publication date Jul 30, 2020
- HAMAMATSU PHOTONICS K. K.
- Akihiro OTAKA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20200176339
- Publication date Jun 4, 2020
- Hamamatsu Photonics K.K.
- Motohiro SUYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20200174074
- Publication date Jun 4, 2020
- Hamamatsu Photonics K.K.
- Motohiro SUYAMA
- H01 - BASIC ELECTRIC ELEMENTS

Tomonori Nakamura

Person

Patents Grantslast 30 patents

Solid immersion lens unit and semiconductor inspection device

Inspection apparatus and inspection method

Semiconductor device inspection method and semiconductor device ins...

Inspection apparatus comprising a first imager imaging fluorescence...

Inspection apparatus and inspection method

Cooling unit, objective lens module, semiconductor inspection devic...

Semiconductor inspection device

Inspection apparatus and inspection method

Device analysis apparatus and device analysis method

Carrier lifespan measurement method and carrier lifespan measuremen...

Measuring device, observing device and measuring method

Concentration measurement method and concentration measurement device

Solid immersion lens unit and semiconductor detector device

Semiconductor inspection device

Semiconductor device inspection method and semiconductor device ins...

Image generating method, image generating device, image generating...

Inspection device and inspection method

Semiconductor device inspection device and semiconductor device ins...

Inspection method and inspection apparatus

Optical device for microscopic observation

Image generating method, image generating device, image generating...

Analysis system and analysis method

Optical polarization inspection device and method

System for testing integrated circuit and method for testing integr...

Light source device and inspection device

Heat generation point detection method and heat generation point de...

Analysis system and analysis method

Analysis system and analysis method

Semiconductor device inspection device and semiconductor device ins...

Image generation apparatus and image generation method

Patents Applicationslast 30 patents

SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

MANUFACTURING METHOD, INSPECTION METHOD, AND INSPECTION DEVICE

INSPECTION METHOD, CONDUCTIVE MEMBER, AND INSPECTION DEVICE

FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD

INSPECTION DEVICE

DISTANCE MEASUREMENT DEVICE

LIGHT SOURCE DEVICE AND DISTANCE MEASUREMENT DEVICE

INSPECTION APPARATUS AND INSPECTION METHOD

SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...

SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...

IMAGING UNIT AND MEASUREMENT DEVICE

HEIGHT MEASUREMENT APPARATUS AND HEIGHT MEASUREMENT METHOD

FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

SOLID IMMERSION LENS UNIT AND SEMICONDUCTOR INSPECTION DEVICE

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

COOLING UNIT, OBJECTIVE LENS MODULE, SEMICONDUCTOR INSPECTION DEVIC...

SEMICONDUCTOR INSPECTION DEVICE

OPTICAL MEASUREMENT DEVICE

CONCENTRATION MEASUREMENT METHOD AND CONCENTRATION MEASUREMENT DEVICE

CARRIER LIFESPAN MEASUREMENT METHOD AND CARRIER LIFESPAN MEASUREMEN...

SEMICONDUCTOR PRODUCTION METHOD AND WAFER INSPECTION METHOD

OPTICAL DEVICE FOR MICROSCOPIC OBSERVATION

IMAGE GENERATING METHOD, IMAGE GENERATING DEVICE, IMAGE GENERATING...

SEMICONDUCTOR WAFER

SEMICONDUCTOR WAFER