Tomoo Yamanouchi

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Miyagi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, manufacturing method of semiconductor device...
- Patent number 11,764,278
- Issue date Sep 19, 2023
- Advantest Corporation
- Kensuke Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, method for manufacturing of semiconductor dev...
- Patent number 8,466,566
- Issue date Jun 18, 2013
- Advantest Corporation
- Makoto Nakanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrum analyzer system and spectrum analyze method
- Patent number 8,072,206
- Issue date Dec 6, 2011
- Advantest Corporation
- Eiji Kanoh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE...
- Publication number 20210320184
- Publication date Oct 14, 2021
- Advantest Corporation
- Kensuke OKUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR APPARATUS
- Publication number 20200312968
- Publication date Oct 1, 2020
- Advantest Corporation
- Kiyotaka KASAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING OF SEMICONDUCTOR DEV...
- Publication number 20120074577
- Publication date Mar 29, 2012
- Advantest Corporation
- Makoto Nakanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTRUM ANALYZER SYSTEM AND SPECTRUM ANALYZE METHOD
- Publication number 20090302829
- Publication date Dec 10, 2009
- Advantest Corporation
- EIJI KANOH
- G01 - MEASURING TESTING