Tomotaka NAGASHIMA

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect detection device and defect detection method
- Patent number 12,099,000
- Issue date Sep 24, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Strain distribution measurement system and strain distribution meas...
- Patent number 12,055,382
- Issue date Aug 6, 2024
- Shimadzu Corporation
- Tomotaka Nagashima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Image Pick-Up System and Image Pick-Up Method
- Publication number 20250005786
- Publication date Jan 2, 2025
- Shimadzu Corporation
- Tomotaka NAGASHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sleeping Video Analysis Method And Sleeping Video Analysis Apparatus
- Publication number 20240242500
- Publication date Jul 18, 2024
- Shimadzu Corporation
- Ayako AKAZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD
- Publication number 20230304787
- Publication date Sep 28, 2023
- Shimadzu Corporation
- Tomotaka NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD
- Publication number 20230236111
- Publication date Jul 27, 2023
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM, IMAGE PROCESSING METHOD, AND DEFECT INSPECTION D...
- Publication number 20230114484
- Publication date Apr 13, 2023
- Shimadzu Corporation
- Tomotaka NAGASHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRAIN DISTRIBUTION MEASUREMENT SYSTEM AND STRAIN DISTRIBUTION MEAS...
- Publication number 20210364276
- Publication date Nov 25, 2021
- Shimadzu Corporation
- Tomotaka NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL TESTING MACHINE AND DISPLAY METHOD IN MATERIAL TESTING MAC...
- Publication number 20210333182
- Publication date Oct 28, 2021
- Shimadzu Corporation
- Takuro SATO
- G01 - MEASURING TESTING

Tomotaka NAGASHIMA

Person

Patents Grantslast 30 patents

Defect detection device and defect detection method

Strain distribution measurement system and strain distribution meas...

Patents Applicationslast 30 patents

Image Pick-Up System and Image Pick-Up Method

Sleeping Video Analysis Method And Sleeping Video Analysis Apparatus

DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD

DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD

INSPECTION SYSTEM, IMAGE PROCESSING METHOD, AND DEFECT INSPECTION D...

STRAIN DISTRIBUTION MEASUREMENT SYSTEM AND STRAIN DISTRIBUTION MEAS...

MATERIAL TESTING MACHINE AND DISPLAY METHOD IN MATERIAL TESTING MAC...