Tomotaka Takahashi

Person

Kawasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus and measurement method
- Patent number 11,867,809
- Issue date Jan 9, 2024
- Mitutoyo Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Single sideband frequency modulated laser measurement for detecting...
- Patent number 11,415,406
- Issue date Aug 16, 2022
- Mitutoyo Corporation
- Shinji Komatsuzaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical encoder with misalignment detection and adjustment method a...
- Patent number 8,895,911
- Issue date Nov 25, 2014
- Mitutoyo Corporation
- Tomotaka Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric encoder
- Patent number 8,666,261
- Issue date Mar 4, 2014
- Mitutoyo Corporation
- Tomotaka Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Offset amount calibrating method and surface texture measuring machine
- Patent number 8,363,904
- Issue date Jan 29, 2013
- Mitutoyo Corporation
- Tomotaka Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder comprising a main and reference light receiving por...
- Patent number 8,173,951
- Issue date May 8, 2012
- Mitutoyo Corporation
- Tomotaka Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for measuring displacement information of an object
- Patent number 8,018,600
- Issue date Sep 13, 2011
- Mitutoyo Corporation
- Tomotaka Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum optical fiber connector and optical fiber terminal structure
- Patent number 7,980,769
- Issue date Jul 19, 2011
- Mitutoyo Corporation
- Tomotaka Takahashi
- G02 - OPTICS
Information Patent Grant
Displacement detector
- Patent number 7,394,550
- Issue date Jul 1, 2008
- Mitutoyo Corporation
- Tomotaka Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting displacement
- Patent number 7,319,526
- Issue date Jan 15, 2008
- Mitutoyo Corporation
- Tomotaka Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric encoder for precise measurements
- Patent number 7,095,011
- Issue date Aug 22, 2006
- Mitutoyo Corporation
- Kenji Kojima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20210356591
- Publication date Nov 18, 2021
- MITUTOYO CORPORATION
- Ryusuke KATO
- G01 - MEASURING TESTING
Information Patent Application
LASER APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD
- Publication number 20210190474
- Publication date Jun 24, 2021
- MITUTOYO CORPORATION
- Shinji KOMATSUZAKI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20210011155
- Publication date Jan 14, 2021
- Mitutoyo Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ENCODER WITH MISALINGMENT DETECTION AND ADJUSTMENT METHOD A...
- Publication number 20120193523
- Publication date Aug 2, 2012
- Mitutoyo Corporation
- Tomotaka TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
PHOTOELECTRIC ENCODER
- Publication number 20110229151
- Publication date Sep 22, 2011
- Mitutoyo Corporation
- Tomotaka TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
OFFSET AMOUNT CALIBRATING METHOD AND SURFACE TEXTURE MEASURING MACHINE
- Publication number 20110085178
- Publication date Apr 14, 2011
- Mitutoyo Corporation
- Tomotaka TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
Optical encoder
- Publication number 20100072348
- Publication date Mar 25, 2010
- Mitutoyo Corporation
- Tomotaka TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
VACUUM OPTICAL FIBER CONNECTOR AND OPTICAL FIBER TERMINAL STRUCTURE
- Publication number 20090232454
- Publication date Sep 17, 2009
- MITUTOYO CORPORATION
- Tomotaka TAKAHASHI
- G02 - OPTICS
Information Patent Application
INTERFEROMETER
- Publication number 20090116034
- Publication date May 7, 2009
- Mitutoyo Corporation
- Tomotaka Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Displacement detector
- Publication number 20060139654
- Publication date Jun 29, 2006
- Mitutoyo Corporation
- Tomotaka Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for detecting displacement
- Publication number 20050140985
- Publication date Jun 30, 2005
- Mitutoyo Corporation
- Tomotaka Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Photoelectric encoder
- Publication number 20040238728
- Publication date Dec 2, 2004
- Mitutoyo Corporation
- Kenji Kojima
- G01 - MEASURING TESTING

Tomotaka Takahashi

Person

Patents Grantslast 30 patents

Measurement apparatus and measurement method

Single sideband frequency modulated laser measurement for detecting...

Optical encoder with misalignment detection and adjustment method a...

Photoelectric encoder

Offset amount calibrating method and surface texture measuring machine

Optical encoder comprising a main and reference light receiving por...

Interferometer for measuring displacement information of an object

Vacuum optical fiber connector and optical fiber terminal structure

Displacement detector

Apparatus for detecting displacement

Photoelectric encoder for precise measurements

Patents Applicationslast 30 patents

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

LASER APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

OPTICAL ENCODER WITH MISALINGMENT DETECTION AND ADJUSTMENT METHOD A...

PHOTOELECTRIC ENCODER

OFFSET AMOUNT CALIBRATING METHOD AND SURFACE TEXTURE MEASURING MACHINE

Optical encoder

VACUUM OPTICAL FIBER CONNECTOR AND OPTICAL FIBER TERMINAL STRUCTURE

INTERFEROMETER

Displacement detector

Apparatus for detecting displacement

Photoelectric encoder