Tomoya Endo

Person

Nirasaki City, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Testing system
- Patent number 11,454,664
- Issue date Sep 27, 2022
- Tokyo Electron Limited
- Kentaro Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method of adjusting position of chuck top
- Patent number 11,454,667
- Issue date Sep 27, 2022
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method of controlling testing apparatus
- Patent number 11,391,758
- Issue date Jul 19, 2022
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Grant
Method for controlling test apparatus and test apparatus
- Patent number 11,385,286
- Issue date Jul 12, 2022
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system
- Patent number 11,360,115
- Issue date Jun 14, 2022
- Tokyo Electron Limited
- Takanori Hyakudomi
- G01 - MEASURING TESTING
Information Patent Grant
Placement apparatus control method, placement apparatus, and inspec...
- Patent number 11,226,368
- Issue date Jan 18, 2022
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and cleaning method of inspection apparatus
- Patent number 11,181,573
- Issue date Nov 23, 2021
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Grant
Aligning mechanism and aligning method
- Patent number 11,131,708
- Issue date Sep 28, 2021
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Grant
Stage device and probe device
- Patent number 10,809,294
- Issue date Oct 20, 2020
- Tokyo Electron Limited
- Tomoya Endo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface apparatus, interface unit, probe apparatus, and connectio...
- Patent number 10,205,279
- Issue date Feb 12, 2019
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Grant
Interface apparatus, interface unit, probe apparatus, and connectio...
- Patent number 10,170,859
- Issue date Jan 1, 2019
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus and method for correcting contact position by adjus...
- Patent number 8,130,004
- Issue date Mar 6, 2012
- Tokyo Electron Limited
- Hiroshi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Transfer mechanism for target object to be inspected
- Patent number 7,994,809
- Issue date Aug 9, 2011
- Tokyo Electron Limited
- Yutaka Akaike
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 7,944,200
- Issue date May 17, 2011
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION METHOD AND INSPECTION DEVICE
- Publication number 20250208169
- Publication date Jun 26, 2025
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240044807
- Publication date Feb 8, 2024
- TOKYO ELECTRON LIMITED
- Tomoya ENDO
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM
- Publication number 20210333319
- Publication date Oct 28, 2021
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD OF CONTROLLING TESTING APPARATUS
- Publication number 20210311094
- Publication date Oct 7, 2021
- TOKYO ELECTRON LIMITED
- Tomoya ENDO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD OF ADJUSTING POSITION OF CHUCK TOP
- Publication number 20210302492
- Publication date Sep 30, 2021
- TOKYO ELECTRON LIMITED
- Tomoya ENDO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING TEST APPARATUS AND TEST APPARATUS
- Publication number 20210088588
- Publication date Mar 25, 2021
- TOKYO ELECTRON LIMITED
- Tomoya ENDO
- G01 - MEASURING TESTING
Information Patent Application
PLACEMENT APPARATUS CONTROL METHOD, PLACEMENT APPARATUS, AND INSPEC...
- Publication number 20210063477
- Publication date Mar 4, 2021
- TOKYO ELECTRON LIMITED
- Tomoya ENDO
- G01 - MEASURING TESTING
Information Patent Application
ALIGNING MECHANISM AND ALIGNING METHOD
- Publication number 20200379037
- Publication date Dec 3, 2020
- TOKYO ELECTRON LIMITED
- Tomoya ENDO
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE TRANSPORTATION METHOD
- Publication number 20200185258
- Publication date Jun 11, 2020
- Tomoya ENDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND CLEANING METHOD OF INSPECTION APPARATUS
- Publication number 20200018791
- Publication date Jan 16, 2020
- TOKYO ELECTRON LIMITED
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20190265272
- Publication date Aug 29, 2019
- TOKYO ELECTRON LIMITED
- Takanori Hyakudomi
- G01 - MEASURING TESTING
Information Patent Application
Interface Apparatus, Interface Unit, Probe Apparatus, and Connectio...
- Publication number 20180277991
- Publication date Sep 27, 2018
- TOKYO ELECTRON LIMITED
- Tomoya ENDO
- G01 - MEASURING TESTING
Information Patent Application
Stage Device and Probe Device
- Publication number 20180217201
- Publication date Aug 2, 2018
- TOKYO ELECTRON LIMITED
- Tomoya ENDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE APPARATUS AND METHOD FOR CORRECTING CONTACT POSITION
- Publication number 20120126841
- Publication date May 24, 2012
- TOKYO ELECTRON LIMITED
- Hiroshi Yamada
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS AND METHOD FOR CORRECTING CONTACT POSITION
- Publication number 20120119766
- Publication date May 17, 2012
- TOKYO ELECTRON LIMITED
- Hiroshi Yamada
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS
- Publication number 20100079161
- Publication date Apr 1, 2010
- TOKYO ELECTON LIMITED
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Application
TRANSFER MECHANISM FOR TARGET OBJECT TO BE INSPECTED
- Publication number 20100001751
- Publication date Jan 7, 2010
- TOKYO ELECTRON LIMITED
- Yutaka Akaike
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS AND METHOD FOR CORRECTING CONTACT POSITION
- Publication number 20090284277
- Publication date Nov 19, 2009
- TOKYO ELECTRON LIMITED
- Hiroshi Yamada
- G01 - MEASURING TESTING

Tomoya Endo

Person

Patents Grantslast 30 patents

Testing system

Inspection apparatus and method of adjusting position of chuck top

Testing apparatus and method of controlling testing apparatus

Method for controlling test apparatus and test apparatus

Inspection system

Placement apparatus control method, placement apparatus, and inspec...

Inspection apparatus and cleaning method of inspection apparatus

Aligning mechanism and aligning method

Stage device and probe device

Interface apparatus, interface unit, probe apparatus, and connectio...

Interface apparatus, interface unit, probe apparatus, and connectio...

Probe apparatus and method for correcting contact position by adjus...

Transfer mechanism for target object to be inspected

Probe apparatus

Patents Applicationslast 30 patents

INSPECTION METHOD AND INSPECTION DEVICE

INSPECTION SYSTEM

TESTING SYSTEM

TESTING APPARATUS AND METHOD OF CONTROLLING TESTING APPARATUS

INSPECTION APPARATUS AND METHOD OF ADJUSTING POSITION OF CHUCK TOP

METHOD FOR CONTROLLING TEST APPARATUS AND TEST APPARATUS

PLACEMENT APPARATUS CONTROL METHOD, PLACEMENT APPARATUS, AND INSPEC...

ALIGNING MECHANISM AND ALIGNING METHOD

SUBSTRATE TRANSPORTATION METHOD

INSPECTION APPARATUS AND CLEANING METHOD OF INSPECTION APPARATUS

INSPECTION SYSTEM

Interface Apparatus, Interface Unit, Probe Apparatus, and Connectio...

Stage Device and Probe Device

PROBE APPARATUS AND METHOD FOR CORRECTING CONTACT POSITION

PROBE APPARATUS AND METHOD FOR CORRECTING CONTACT POSITION

PROBE APPARATUS

TRANSFER MECHANISM FOR TARGET OBJECT TO BE INSPECTED

PROBE APPARATUS AND METHOD FOR CORRECTING CONTACT POSITION