Tomoya FUMIKURA

Follow

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and inspection device
- Patent number 12,040,303
- Issue date Jul 16, 2024
- Kabushiki Kaisha Toshiba
- Mitsuaki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection system, detection device, and detection method
- Patent number 11,073,498
- Issue date Jul 27, 2021
- Kabushiki Kaisha Toshiba
- Tomoya Fumikura
- G01 - MEASURING TESTING
Information Patent Grant
Detection system, detection device, and detection method
- Patent number 11,041,830
- Issue date Jun 22, 2021
- Kabushiki Kaisha Toshiba
- Tomoya Fumikura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND INSPECTION DEVICE
- Publication number 20210296279
- Publication date Sep 23, 2021
- Kabushiki Kaisha Toshiba
- Mitsuaki KATO
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM, DETECTION DEVICE, AND DETECTION METHOD
- Publication number 20200018729
- Publication date Jan 16, 2020
- Kabushiki Kaisha Toshiba
- Tomoya FUMIKURA
- G01 - MEASURING TESTING