Tomoya IHARA

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Temperature distribution evaluation method, temperature distributio...
- Patent number 12,131,960
- Issue date Oct 29, 2024
- Kwansei Gakuin Educational Foundation
- Tadaaki Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SiC semiconductor substrate, method for manufacturing same, and dev...
- Patent number 12,020,928
- Issue date Jun 25, 2024
- Kwansei Gakuin Educational Foundation
- Tadaaki Kaneko
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE DISTRIBUTION EVALUATION METHOD, TEMPERATURE DISTRIBUTIO...
- Publication number 20220216116
- Publication date Jul 7, 2022
- KWANSEI GAKUIN EDUCATIONAL FOUNDATION
- Tadaaki KANEKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIC SEMICONDUCTOR SUBSTRATE, AND, PRODUCTION METHOD THEREFOR AND PR...
- Publication number 20210399095
- Publication date Dec 23, 2021
- KWANSEI GAKUIN EDUCATIONAL FOUNDATION
- Tadaaki KANEKO
- C30 - CRYSTAL GROWTH
Information Patent Application
SIC SEMICONDUCTOR SUBSTRATE, METHOD FOR MANUFACTURING SAME, AND DEV...
- Publication number 20210398807
- Publication date Dec 23, 2021
- KWANSEI GAKUIN EDUCATIONAL FOUNDATION
- Tadaaki KANEKO
- C30 - CRYSTAL GROWTH