Tomoya Sanuki

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Radiation detector, radiation detection module and radiation detect...
- Patent number 9,134,440
- Issue date Sep 15, 2015
- Kabushiki Kaisha Toshiba
- Tomoya Sanuki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,737,466
- Issue date Jun 15, 2010
- Kabushiki Kaisha Toshiba
- Kaoru Hiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,605,442
- Issue date Oct 20, 2009
- Kabushiki Kaisha Toshiba
- Osamu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,019,380
- Issue date Mar 28, 2006
- Kabushiki Kaisha Toshiba
- Tomoya Sanuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of fabricating the same
- Patent number 6,989,560
- Issue date Jan 24, 2006
- Kabushiki Kaisha Toshiba
- Hidetoshi Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor trench capacitor
- Patent number 6,667,503
- Issue date Dec 23, 2003
- Kabushiki Kaisha Toshiba
- Hidetoshi Koike
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MAGNETORESISTIVE MEMORY DEVICE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20170256584
- Publication date Sep 7, 2017
- Kabushiki Kaisha Toshiba
- Tomoya SANUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT MANUFACTURING METHOD
- Publication number 20150311079
- Publication date Oct 29, 2015
- Kabushiki Kaisha Toshiba
- Takayuki Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIATION DETECTOR, RADIATION DETECTION MODULE AND RADIATION DETECT...
- Publication number 20140284488
- Publication date Sep 25, 2014
- KABUSHIKI KAISHA TOSHIBA
- Tomoya Sanuki
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20140217515
- Publication date Aug 7, 2014
- Kabushiki Kaisha Toshiba
- Takayuki Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20110233685
- Publication date Sep 29, 2011
- Kabushiki Kaisha Toshiba
- Takayuki Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING MOS FIELD EFFECT TRANSISTOR AND METH...
- Publication number 20090095992
- Publication date Apr 16, 2009
- Tomoya SANUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090057777
- Publication date Mar 5, 2009
- Kabushiki Kaisha Toshiba
- Osamu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20070290208
- Publication date Dec 20, 2007
- Kabushiki Kaisha Toshiba
- Kaoru Hiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20070131969
- Publication date Jun 14, 2007
- Kabushiki Kaisha Toshiba
- Tomoya Sanuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOS semiconductor device
- Publication number 20070034940
- Publication date Feb 15, 2007
- Kabushiki Kaisha Toshiba
- Tomoya Sanuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20060091475
- Publication date May 4, 2006
- Kabushiki Kaisha Toshiba
- Osamu Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20050151163
- Publication date Jul 14, 2005
- Kabushiki Kaisha Toshiba
- Kaoru Hiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20040256674
- Publication date Dec 23, 2004
- Kabushiki Kaisha Toshiba
- Tomoya Sanuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of fabricating the same
- Publication number 20040065914
- Publication date Apr 8, 2004
- Kabushiki Kaisha Toshiba
- Hidetoshi Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of fabricating the same
- Publication number 20020135007
- Publication date Sep 26, 2002
- Kabushiki Kaisha Toshiba
- Hidetoshi Koike
- H01 - BASIC ELECTRIC ELEMENTS

Tomoya Sanuki

Person

Patents Grantslast 30 patents

Radiation detector, radiation detection module and radiation detect...

Semiconductor device and manufacturing method thereof

Semiconductor device

Semiconductor device

Semiconductor device and method of fabricating the same

Semiconductor trench capacitor

Patents Applicationslast 30 patents

MAGNETORESISTIVE MEMORY DEVICE AND MANUFACTURING METHOD OF THE SAME

SEMICONDUCTOR INTEGRATED CIRCUIT MANUFACTURING METHOD

RADIATION DETECTOR, RADIATION DETECTION MODULE AND RADIATION DETECT...

SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR DEVICE INCLUDING MOS FIELD EFFECT TRANSISTOR AND METH...

SEMICONDUCTOR DEVICE

Semiconductor device and manufacturing method thereof

Semiconductor device and method of manufacturing the same

MOS semiconductor device

Semiconductor device

Semiconductor device and manufacturing method thereof

Semiconductor device

Semiconductor device and method of fabricating the same

Semiconductor device and method of fabricating the same