Tomoya Sato

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Hirakawa-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Contact for electrical test of electronic devices, probe assembly a...
- Patent number 8,063,651
- Issue date Nov 22, 2011
- Kabushiki Kaisha Nihon Micronics
- Shoji Kamata
- G01 - MEASURING TESTING
Information Patent Grant
Current test probe having a solder guide portion, and related probe...
- Patent number 7,888,958
- Issue date Feb 15, 2011
- Kabushiki Kaisha Nihon Micronics
- Akira Souma
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE FOR CURRENT TEST, PROBE ASSEMBLY AND PRODUCTION METHOD THEREOF
- Publication number 20100213956
- Publication date Aug 26, 2010
- KABUSHIKI KAISHA NIHON MICRONICS
- Akira Souma
- G01 - MEASURING TESTING
Information Patent Application
CONTACT FOR ELECTRICAL TEST OF ELECTRONIC DEVICES, METHOD FOR MANUF...
- Publication number 20090273357
- Publication date Nov 5, 2009
- Kabushiki Kaisha Nihon Micronics
- Shoji Kamata
- G01 - MEASURING TESTING