Tomoya TAMURA

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect inspection device, defect inspection method, and defect insp...
- Patent number 9,240,041
- Issue date Jan 19, 2016
- Lasertec Corporation
- Tomoya Tamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus, inspection method, and manufacturing method o...
- Patent number 7,548,309
- Issue date Jun 16, 2009
- Lasertec Corporation
- Haruhiko Kusunose
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND DEFECT INSP...
- Publication number 20130322735
- Publication date Dec 5, 2013
- Lasertec Corporation
- Tomoya Tamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS, INSPECTION METHOD, AND MANUFACTURING METHOD O...
- Publication number 20080192238
- Publication date Aug 14, 2008
- Lasertec Corporation
- Haruhiko KUSUNOSE
- G01 - MEASURING TESTING