Tomoyu Yamashita

Person

Saitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Light beam incident device and reflected light measurement device
- Patent number 9,568,422
- Issue date Feb 14, 2017
- Advantest Corporation
- Tomoyu Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Pulse light source, and method for stably controlling phase differe...
- Patent number 9,190,804
- Issue date Nov 17, 2015
- Advantest Corporation
- Tomoyu Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 9,176,008
- Issue date Nov 3, 2015
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Repetition frequency control device
- Patent number 8,718,108
- Issue date May 6, 2014
- Advantest Corporation
- Tomoyu Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal output device, and output apparatus of signal source of sign...
- Patent number 8,676,061
- Issue date Mar 18, 2014
- Advantest Corporation
- Tomoyu Yamashita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 8,493,057
- Issue date Jul 23, 2013
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 8,481,938
- Issue date Jul 9, 2013
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Repetition frequency control device
- Patent number 8,306,078
- Issue date Nov 6, 2012
- Advantest Corporation
- Tomoyu Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical measuring apparatus
- Patent number 8,279,438
- Issue date Oct 2, 2012
- Advantest Corporation
- Tomoyu Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring apparatus, measurement method, a pro...
- Patent number 8,183,528
- Issue date May 22, 2012
- Advantest Corporation
- Eiji Kato
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device, method, program, and recording medium
- Patent number 7,697,122
- Issue date Apr 13, 2010
- Advantest Corporation
- Tomoyu Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Polarization mode dispersion measuring device, method, recording me...
- Patent number 7,006,207
- Issue date Feb 28, 2006
- Advantest Corporation
- Takeshi Ozeki
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measuring apparatus, the method thereof and...
- Patent number 6,426,792
- Issue date Jul 30, 2002
- Advantest Corporation
- Tomoyu Yamashita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PULSE LIGHT SOURCE, AND METHOD FOR STABLY CONTROLLING PHASE DIFFERE...
- Publication number 20150194786
- Publication date Jul 9, 2015
- Advantest Corporation
- Tomoyu YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REFLECTION MEASUREMENT APPARATUS
- Publication number 20140168652
- Publication date Jun 19, 2014
- Advantest Corporation
- Tomoyu YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20130240736
- Publication date Sep 19, 2013
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
REPETITION FREQUENCY CONTROL DEVICE
- Publication number 20120163404
- Publication date Jun 28, 2012
- Advantest Corporation
- Tomoyu YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REPETITION FREQUENCY CONTROL DEVICE
- Publication number 20120155500
- Publication date Jun 21, 2012
- Advantest Corporation
- Tomoyu YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE CONTROL DEVICE FOR LASER LIGHT PULSE
- Publication number 20110216791
- Publication date Sep 8, 2011
- Advantest Corporation
- Tomoyu YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIGNAL OUTPUT DEVICE, AND OUTPUT APPARATUS OF SIGNAL SOURCE OF SIGN...
- Publication number 20110170875
- Publication date Jul 14, 2011
- Advantest Corporation
- Tomoyu YAMASHITA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20110001048
- Publication date Jan 6, 2011
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20100295534
- Publication date Nov 25, 2010
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASUREMENT METHOD, A PRO...
- Publication number 20100271001
- Publication date Oct 28, 2010
- Advantest Corporation
- Eiji KATO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING APPARATUS
- Publication number 20100014079
- Publication date Jan 21, 2010
- Advantest Coporation
- Tomoyu YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
Measuring Device, Method, Program, and Recording Medium
- Publication number 20080231850
- Publication date Sep 25, 2008
- Advantest Corporation
- Tomoyu Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Polarization mode dispersion measuring device, method, recording me...
- Publication number 20050052638
- Publication date Mar 10, 2005
- Takeshi Ozeki
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method of measuring polarization mode dispersion, and...
- Publication number 20020171829
- Publication date Nov 21, 2002
- Advantest Corporation
- Tomoyu Yamashita
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHARACTERISTIC MEASURING APPARATUS, THE METHOD THEREOF AND...
- Publication number 20020085194
- Publication date Jul 4, 2002
- Tomoyu Yamashita
- G01 - MEASURING TESTING

Tomoyu Yamashita

Person

Patents Grantslast 30 patents

Light beam incident device and reflected light measurement device

Pulse light source, and method for stably controlling phase differe...

Electromagnetic wave measuring apparatus, measuring method, program...

Repetition frequency control device

Signal output device, and output apparatus of signal source of sign...

Electromagnetic wave measuring apparatus, measuring method, program...

Electromagnetic wave measuring apparatus, measuring method, program...

Repetition frequency control device

Optical measuring apparatus

Electromagnetic wave measuring apparatus, measurement method, a pro...

Measuring device, method, program, and recording medium

Polarization mode dispersion measuring device, method, recording me...

Optical characteristic measuring apparatus, the method thereof and...

Patents Applicationslast 30 patents

PULSE LIGHT SOURCE, AND METHOD FOR STABLY CONTROLLING PHASE DIFFERE...

REFLECTION MEASUREMENT APPARATUS

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...

REPETITION FREQUENCY CONTROL DEVICE

REPETITION FREQUENCY CONTROL DEVICE

PHASE CONTROL DEVICE FOR LASER LIGHT PULSE

SIGNAL OUTPUT DEVICE, AND OUTPUT APPARATUS OF SIGNAL SOURCE OF SIGN...

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASUREMENT METHOD, A PRO...

OPTICAL MEASURING APPARATUS

Measuring Device, Method, Program, and Recording Medium

Polarization mode dispersion measuring device, method, recording me...

Apparatus and method of measuring polarization mode dispersion, and...

OPTICAL CHARACTERISTIC MEASURING APPARATUS, THE METHOD THEREOF AND...