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Tomoyuki ASAHARA
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Kobe-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Sample processing system
Patent number
10,197,550
Issue date
Feb 5, 2019
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing device, reagent preparing method, and specimen pr...
Patent number
10,161,950
Issue date
Dec 25, 2018
Sysmex Corporation
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer, transportation apparatus, and method
Patent number
10,101,346
Issue date
Oct 16, 2018
SYSMEX CORPORATION
Hiroki Koike
G01 - MEASURING TESTING
Information
Patent Grant
Sample analysis system and sample analyzer
Patent number
9,829,497
Issue date
Nov 28, 2017
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Specimen storage device, specimen storing method, and specimen test...
Patent number
9,377,480
Issue date
Jun 28, 2016
Sysmex Corporation
Tomoyuki Asahara
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparation apparatus and specimen processing system
Patent number
9,316,660
Issue date
Apr 19, 2016
Sysmex Corporation
Tomoyuki Asahara
G01 - MEASURING TESTING
Information
Patent Grant
Specimen transporter and specimen imaging system
Patent number
9,297,823
Issue date
Mar 29, 2016
Sysmex Corporation
Mitsuo Yamasaki
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing device, reagent preparing method and specimen pro...
Patent number
9,207,250
Issue date
Dec 8, 2015
SYSMEX CORPORATION
Tomoyuki Asahara
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing device, specimen processing system and reagent pr...
Patent number
9,164,021
Issue date
Oct 20, 2015
Sysmex Corporation
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Specimen transporter, specimen testing system and specimen transpor...
Patent number
9,157,925
Issue date
Oct 13, 2015
Sysmex Corporation
Mitsuo Yamasaki
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing device, specimen measuring device and reagent pre...
Patent number
8,906,302
Issue date
Dec 9, 2014
Sysmex Corporation
Noriyuki Nakanishi
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing device and specimen processing system
Patent number
8,894,932
Issue date
Nov 25, 2014
Sysmex Corporation
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Sample rack transport system and sample rack transport method
Patent number
8,828,319
Issue date
Sep 9, 2014
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing apparatus and method for transporting rack
Patent number
8,752,440
Issue date
Jun 17, 2014
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing apparatus and sample rack transporting method
Patent number
8,731,709
Issue date
May 20, 2014
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Sample testing apparatus with controled sample transport mechanism...
Patent number
8,641,969
Issue date
Feb 4, 2014
Sysmex Corporation
Nobuhiro Kitagawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CONTROL METHOD FOR TEST SYSTEM, CONTROL METHOD FOR SMEAR PREPARATIO...
Publication number
20230408381
Publication date
Dec 21, 2023
SYSMEX CORPORATION
Daiki Kawakami
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SAMPLE ANALYZER, TRANSPORTATION APPARATUS, AND METHOD
Publication number
20160349279
Publication date
Dec 1, 2016
SYSMEX CORPORATION
Hiroki KOIKE
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN STORAGE DEVICE, SPECIMEN STORING METHOD, AND SPECIMEN TEST...
Publication number
20140093424
Publication date
Apr 3, 2014
SYSMEX CORPORATION
Tomoyuki ASAHARA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN TRANSPORTER, SPECIMEN TESTING SYSTEM AND SPECIMEN TRANSPOR...
Publication number
20140093967
Publication date
Apr 3, 2014
SYSMEX CORPORATION
Mitsuo YAMASAKI
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN TRANSPORTER AND SPECIMEN IMAGING SYSTEM
Publication number
20140093423
Publication date
Apr 3, 2014
SYSMEX CORPORATION
Mitsuo YAMASAKI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYSIS SYSTEM AND SAMPLE ANALYZER
Publication number
20140037502
Publication date
Feb 6, 2014
SYSMEX CORPORATION
Hiroo TATSUTANI
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARATION APPARATUS AND SPECIMEN PROCESSING SYSTEM
Publication number
20110311396
Publication date
Dec 22, 2011
Tomoyuki Asahara
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS AND METHOD FOR TRANSPORTING RACK
Publication number
20110290040
Publication date
Dec 1, 2011
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE RACK TRANSPORT SYSTEM AND SAMPLE RACK TRANSPORT METHOD
Publication number
20110244583
Publication date
Oct 6, 2011
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING SYSTEM
Publication number
20110189053
Publication date
Aug 4, 2011
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS AND SAMPLE RACK TRANSPORTING METHOD
Publication number
20110160899
Publication date
Jun 30, 2011
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARING DEVICE AND SPECIMEN PROCESSING SYSTEM
Publication number
20100247383
Publication date
Sep 30, 2010
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE TESTING APPARATUS AND SAMPLE TESTING METHOD
Publication number
20100248374
Publication date
Sep 30, 2010
SYSMEX CORPORATION
Nobuhiro KITAGAWA
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARING DEVICE, REAGENT PREPARING METHOD, AND SPECIMEN PR...
Publication number
20100248208
Publication date
Sep 30, 2010
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARING DEVICE, REAGENT PREPARING METHOD AND SPECIMEN PRO...
Publication number
20100248289
Publication date
Sep 30, 2010
Tomoyuki Asahara
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARING DEVICE, SPECIMEN MEASURING DEVICE AND REAGENT PRE...
Publication number
20100216223
Publication date
Aug 26, 2010
Noriyuki Nakanishi
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARING DEVICE, SPECIMEN PROCESSING SYSTEM AND REAGENT PR...
Publication number
20100216224
Publication date
Aug 26, 2010
Koichi Okubo
G01 - MEASURING TESTING