Tomoyuki Iwata

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Hamura-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray stress measurement apparatus
- Patent number 8,855,266
- Issue date Oct 7, 2014
- Rigaku Corporation
- Shoichi Yasukawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scattering Measurement Analysis Method, Scattering Measurement Anal...
- Publication number 20210200922
- Publication date Jul 1, 2021
- Rigaku Corporation
- Tomoyuki IWATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY STRESS MEASUREMENT APPARATUS
- Publication number 20130039469
- Publication date Feb 14, 2013
- Rigaku Corporation
- Shoichi Yasukawa
- G01 - MEASURING TESTING