Tomoyuki Kurosawa

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Hitachi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Mass analysis method and mass analysis apparatus
- Patent number 7,485,852
- Issue date Feb 3, 2009
- Hitachi High-Technologies Corporation
- Hiromichi Yamashita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Mass analysis method and mass analysis apparatus
- Publication number 20060289736
- Publication date Dec 28, 2006
- Hitachi High-Technologies Corporation
- Hiromichi Yamashita
- G01 - MEASURING TESTING