Tomoyuki Naganuma

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample loading method and charged particle beam apparatus
- Patent number 11,705,303
- Issue date Jul 18, 2023
- Jeol Ltd.
- Tomoyuki Naganuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system
- Patent number 11,342,158
- Issue date May 24, 2022
- Jeol Ltd.
- Izuru Chiyo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Sample Loading Method and Charged Particle Beam Apparatus
- Publication number 20220216030
- Publication date Jul 7, 2022
- JEOL Ltd.
- Tomoyuki Naganuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System
- Publication number 20210313142
- Publication date Oct 7, 2021
- JEOL Ltd.
- Izuru Chiyo
- H01 - BASIC ELECTRIC ELEMENTS