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Tomoyuki NOSE
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Kobe-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Detection apparatus and damper structure
Patent number
11,927,599
Issue date
Mar 12, 2024
JVCKENWOOD CORPORATION
Masahiro Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting test substance, sample analysis cartridge, and...
Patent number
11,656,223
Issue date
May 23, 2023
Sysmex Corporation
Kazuyoshi Horii
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Cartridge, detection method, and detection device
Patent number
11,511,246
Issue date
Nov 29, 2022
Sysmex Corporation
Yongjian Yang
G01 - MEASURING TESTING
Information
Patent Grant
Chemiluminescence measurement apparatus
Patent number
11,480,525
Issue date
Oct 25, 2022
Sysmex Corporation
Sayuri Tomoda
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Sample measuring method and sample measurement device
Patent number
11,327,086
Issue date
May 10, 2022
Sysmex Corporation
Tomoyuki Nose
G01 - MEASURING TESTING
Information
Patent Grant
Liquid sealed cartridge, method for producing liquid sealed cartrid...
Patent number
11,266,985
Issue date
Mar 8, 2022
Sysmex Corporation
Kazuyoshi Horii
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Measurement method and measurement device
Patent number
11,231,373
Issue date
Jan 25, 2022
Sysmex Corporation
Tomoyuki Nose
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Liquid-sealed cartridge and liquid transferring method
Patent number
11,117,135
Issue date
Sep 14, 2021
Sysmex Corporation
Kazuyoshi Horii
G01 - MEASURING TESTING
Information
Patent Grant
Detection apparatus and detection method
Patent number
11,099,182
Issue date
Aug 24, 2021
Sysmex Corporation
Kazuyoshi Horii
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Method of detecting test substance, sample analysis cartridge, and...
Patent number
11,073,514
Issue date
Jul 27, 2021
Sysmex Corporation
Kazuyoshi Horii
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Method of detecting test substance, sample analysis cartridge, and...
Patent number
10,473,652
Issue date
Nov 12, 2019
SYSMEX CORPORATION
Kazuyoshi Horii
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Measurement apparatus and measurement method
Patent number
10,393,765
Issue date
Aug 27, 2019
Sysmex Corporation
Takao Fujiwara
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzing method using sample analysis cartridge, sample ana...
Patent number
9,752,989
Issue date
Sep 5, 2017
SYSMEX CORPORATION
Kazuyoshi Horii
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF DETECTING TEST SUBSTANCE, SAMPLE ANALYSIS CARTRIDGE, AND...
Publication number
20210318297
Publication date
Oct 14, 2021
SYSMEX CORPORATION
Kazuyoshi HORII
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
DETECTION APPARATUS AND DAMPER STRUCTURE
Publication number
20210231696
Publication date
Jul 29, 2021
JVCKENWOOD CORPORATION
Masahiro Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
DETECTION APPARATUS AND DETECTION METHOD
Publication number
20210148905
Publication date
May 20, 2021
Sysmex Corporation
Kazuyoshi HORII
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DETECTING TEST SUBSTANCE, SAMPLE ANALYSIS CARTRIDGE, AND...
Publication number
20200011861
Publication date
Jan 9, 2020
SYSMEX CORPORATION
Kazuyoshi HORII
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE MEASURING METHOD AND SAMPLE MEASUREMENT DEVICE
Publication number
20190162740
Publication date
May 30, 2019
SYSMEX CORPORATION
Tomoyuki NOSE
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT METHOD AND MEASUREMENT DEVICE
Publication number
20190162670
Publication date
May 30, 2019
SYSMEX CORPORATION
Tomoyuki NOSE
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
CARTRIDGE, DETECTION METHOD, AND DETECTION DEVICE
Publication number
20190099728
Publication date
Apr 4, 2019
SYSMEX CORPORATION
Yongjian Yang
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
LIQUID SEALED CARTRIDGE, METHOD FOR PRODUCING LIQUID SEALED CARTRID...
Publication number
20180126377
Publication date
May 10, 2018
SYSMEX CORPORATION
Kazuyoshi HORII
G01 - MEASURING TESTING
Information
Patent Application
LIQUID-SEALED CARTRIDGE AND LIQUID TRANSFERRING METHOD
Publication number
20180117583
Publication date
May 3, 2018
SYSMEX CORPORATION
Kazuyoshi HORII
G01 - MEASURING TESTING
Information
Patent Application
MEASURING CARTRIDGE AND LIQUID TRANSPORT METHOD
Publication number
20180117501
Publication date
May 3, 2018
SYSMEX CORPORATION
Tomoyuki NOSE
G01 - MEASURING TESTING
Information
Patent Application
DETECTION APPARATUS AND DETECTION METHOD
Publication number
20180003704
Publication date
Jan 4, 2018
SYSMEX CORPORATION
Kazuyoshi HORII
B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information
Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
Publication number
20180003732
Publication date
Jan 4, 2018
SYSMEX CORPORATION
Takao FUJIWARA
G01 - MEASURING TESTING
Information
Patent Application
CHEMILUMINESCENCE MEASUREMENT APPARATUS
Publication number
20180003642
Publication date
Jan 4, 2018
SYSMEX CORPORATION
Sayuri TOMODA
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZING METHOD USING SAMPLE ANALYSIS CARTRIDGE, SAMPLE ANA...
Publication number
20160320307
Publication date
Nov 3, 2016
SYSMEX CORPORATION
Kazuyoshi HORII
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DETECTING TEST SUBSTANCE, SAMPLE ANALYSIS CARTRIDGE, AND...
Publication number
20160320375
Publication date
Nov 3, 2016
SYSMEX CORPORATION
Kazuyoshi HORII
G01 - MEASURING TESTING