Membership
Tour
Register
Log in
Tomoyuki Tobita
Follow
Person
Hitachinaka, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Capillary array apparatus, method of manufacturing the same, and el...
Patent number
7,422,672
Issue date
Sep 9, 2008
Hitachi High-Technologies Corporation
Syozo Kasai
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometer
Patent number
7,053,367
Issue date
May 30, 2006
Hitachi High-Technologies Corporation
Tomoyuki Tobita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample dispensing apparatus and automatic analyzer using the same
Patent number
7,027,935
Issue date
Apr 11, 2006
Hitachi High-Technologies Corp.
Akihiro Shimase
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzing monitor and combustion control system using the same
Patent number
6,580,067
Issue date
Jun 17, 2003
Hitachi, Ltd.
Masuyoshi Yamada
F23 - COMBUSTION APPARATUS COMBUSTION PROCESSES
Information
Patent Grant
Process state detector, semiconductor sensor and display device for...
Patent number
6,016,706
Issue date
Jan 25, 2000
Hitachi, Ltd.
Yoshimi Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Composite condition detection apparatus for detecting static pressu...
Patent number
5,677,493
Issue date
Oct 14, 1997
Hitachi, Ltd.
Yoshimi Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor pressure sensor
Patent number
5,672,826
Issue date
Sep 30, 1997
Hitachi, Ltd.
Hideo Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Multi-function differential pressure sensor with thin supporting base
Patent number
5,635,649
Issue date
Jun 3, 1997
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Differential pressure transmitter having symmetrical construction
Patent number
5,621,175
Issue date
Apr 15, 1997
Hitachi, Ltd.
Akira Nagasu
G01 - MEASURING TESTING
Information
Patent Grant
Process detection apparatus
Patent number
5,554,809
Issue date
Sep 10, 1996
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Compact differential pressure transmitter having first and second d...
Patent number
5,531,120
Issue date
Jul 2, 1996
Hitachi, Ltd.
Akira Nagasu
G01 - MEASURING TESTING
Information
Patent Grant
Process condition detecting apparatus and semiconductor sensor cond...
Patent number
5,528,940
Issue date
Jun 25, 1996
Hitachi, Ltd.
Yoshimi Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Multi-function differential pressure sensor with thin stationary base
Patent number
5,477,738
Issue date
Dec 26, 1995
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-function fluid measuring and transmitting apparatus
Patent number
5,469,749
Issue date
Nov 28, 1995
Hitachi, Ltd.
Satoshi Shimada
G01 - MEASURING TESTING
Information
Patent Grant
Differential pressure sensor capable of removing influence of stati...
Patent number
5,412,992
Issue date
May 9, 1995
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Integrated multisensor and static and differential pressure transmi...
Patent number
5,259,248
Issue date
Nov 9, 1993
Hitachi Ltd.
Seiichi Ugai
G01 - MEASURING TESTING
Information
Patent Grant
Pressure measuring sensor
Patent number
5,257,546
Issue date
Nov 2, 1993
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Differential pressure transmitter
Patent number
4,995,266
Issue date
Feb 26, 1991
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor pressure converting device
Patent number
4,972,716
Issue date
Nov 27, 1990
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor differential pressure transducer
Patent number
4,546,653
Issue date
Oct 15, 1985
Hitachi, Ltd.
Tomoyuki Tobita
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
NUCLEIC ACID ANALYZER
Publication number
20090221060
Publication date
Sep 3, 2009
Hitachi High-Technologies Corporation
Shuhei Yamamoto
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
CAPILLARY ARRAY APPARATUS, METHOD OF MANUFACTURING THE SAME, AND EL...
Publication number
20080302665
Publication date
Dec 11, 2008
Syozo Kasai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Mass spectrometer
Publication number
20040262512
Publication date
Dec 30, 2004
Tomoyuki Tobita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Capillary array apparatus, method of manufacturing the same, and el...
Publication number
20040144652
Publication date
Jul 29, 2004
Syozo Kasai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Sample dispensing apparatus and automatic analyzer using the same
Publication number
20040034479
Publication date
Feb 19, 2004
Akihiro Shimase
G01 - MEASURING TESTING