Tomás Vystavël

Person

Brno, CZ

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for pre-aligning samples for more efficient pro...
- Patent number 12,106,931
- Issue date Oct 1, 2024
- FEI Company
- Michal Hrouzek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Offcut angle determination using electron channeling patterns
- Patent number 11,650,171
- Issue date May 16, 2023
- FEI Company
- Han Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for wafer defect inspection
- Patent number 11,513,079
- Issue date Nov 29, 2022
- FEI Company
- Roger Alvis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for imaging a multi-pillar sample
- Patent number 11,476,079
- Issue date Oct 18, 2022
- FEI Company
- Jakub Kuba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement and endpointing of sample thickness
- Patent number 10,978,272
- Issue date Apr 13, 2021
- FEI Company
- Tomas Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen preparation and inspection in a dual-beam charged particle...
- Patent number 10,629,409
- Issue date Apr 21, 2020
- FEI Company
- Frantisek Vaske
- G01 - MEASURING TESTING
Information Patent Grant
Method of modifying a sample surface layer from a microscopic sample
- Patent number 10,105,734
- Issue date Oct 23, 2018
- FEI Company
- Tomas Vystavel
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Reinforced sample for transmission electron microscope
- Patent number 9,837,246
- Issue date Dec 5, 2017
- FEI Company
- Remco Theodorus Johannes Petrus Geurts
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen holder for a charged particle microscope
- Patent number 9,741,527
- Issue date Aug 22, 2017
- FEI Company
- Tomas Vystavel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR PRE-ALIGNING SAMPLES FOR MORE EFFICIENT PRO...
- Publication number 20230377834
- Publication date Nov 23, 2023
- FEI Company
- Michal HROUZEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OFFCUT ANGLE DETERMINATION USING ELECTRON CHANNELING PATTERNS
- Publication number 20220412900
- Publication date Dec 29, 2022
- FEI Company
- Han Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR IMAGING A MULTI-PILLAR SAMPLE
- Publication number 20220319799
- Publication date Oct 6, 2022
- FEI Company
- Jakub Kuba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Data Acquisition and Processing Techniques for Three-Dimensional Re...
- Publication number 20220208508
- Publication date Jun 30, 2022
- FEI Company
- Oleksii KAPLENKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR WAFER DEFECT INSPECTION
- Publication number 20220113262
- Publication date Apr 14, 2022
- FEI Company
- Roger Alvis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220065804
- Publication date Mar 3, 2022
- FEI Company
- Oleksii Kaplenko
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DIFFRACTION PATTERN ACQUISITIONMETHOD FOR DIFFRACTION PA...
- Publication number 20210404978
- Publication date Dec 30, 2021
- FEI Company
- Tomás Vystavel
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DYNAMIC BAND CONTRAST IMAGING
- Publication number 20210375582
- Publication date Dec 2, 2021
- FEI Company
- Tomás Vystavêl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS
- Publication number 20200135427
- Publication date Apr 30, 2020
- FEI Company
- Tomás Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRAINING AN ARTIFICIAL NEURAL NETWORK USING SIMULATED SPECIMEN IMAGES
- Publication number 20200034956
- Publication date Jan 30, 2020
- FEI Company
- Ondrej Machek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR SAMPLE ORIENTATION FOR TEM LAMELLA PREPARATION
- Publication number 20190198287
- Publication date Jun 27, 2019
- FEI Company
- Tomás Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN PREPARATION AND INSPECTION IN A DUAL-BEAM CHARGED PARTICLE...
- Publication number 20190108971
- Publication date Apr 11, 2019
- FEI Company
- Frantisek Vaske
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYOGENIC SPECIMEN PROCESSING IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20180114671
- Publication date Apr 26, 2018
- FEI Company
- John Mitchels
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT FOR X-RAY TOMOGRAPHY
- Publication number 20180100815
- Publication date Apr 12, 2018
- FEI Company
- Pavel Stejskal
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANIPULATING A SAMPLE IN AN EVACUATED CHAMBER OF A CHARGE...
- Publication number 20160307727
- Publication date Oct 20, 2016
- FEI Company
- Tomás Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MODIFYING A SAMPLE SURFACE LAYER FROM A MICROSCOPIC SAMPLE
- Publication number 20160199878
- Publication date Jul 14, 2016
- FEI Company
- Tomas Vystavel
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
SPECIMEN HOLDER FOR A CHARGED PARTICLE MICROSCOPE
- Publication number 20160181059
- Publication date Jun 23, 2016
- FEI Company
- Tomas Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ACQUIRING EBSP PATTERNS
- Publication number 20160054240
- Publication date Feb 25, 2016
- FEI Company
- Marek Uncovský
- G01 - MEASURING TESTING
Information Patent Application
Method of Sampling a Sample and Displaying Obtained Information
- Publication number 20140146160
- Publication date May 29, 2014
- FEI Company
- Pavel Potocek
- G01 - MEASURING TESTING

Tomás Vystavël

Person

Patents Grantslast 30 patents

Systems and methods for pre-aligning samples for more efficient pro...

Offcut angle determination using electron channeling patterns

Method and system for wafer defect inspection

Method and system for imaging a multi-pillar sample

Measurement and endpointing of sample thickness

Specimen preparation and inspection in a dual-beam charged particle...

Method of modifying a sample surface layer from a microscopic sample

Reinforced sample for transmission electron microscope

Specimen holder for a charged particle microscope

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR PRE-ALIGNING SAMPLES FOR MORE EFFICIENT PRO...

OFFCUT ANGLE DETERMINATION USING ELECTRON CHANNELING PATTERNS

METHOD AND SYSTEM FOR IMAGING A MULTI-PILLAR SAMPLE

Data Acquisition and Processing Techniques for Three-Dimensional Re...

METHOD AND SYSTEM FOR WAFER DEFECT INSPECTION

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE BEAM APPARATUS

METHOD FOR DIFFRACTION PATTERN ACQUISITIONMETHOD FOR DIFFRACTION PA...

METHOD AND SYSTEM FOR DYNAMIC BAND CONTRAST IMAGING

MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS

TRAINING AN ARTIFICIAL NEURAL NETWORK USING SIMULATED SPECIMEN IMAGES

METHOD FOR SAMPLE ORIENTATION FOR TEM LAMELLA PREPARATION

SPECIMEN PREPARATION AND INSPECTION IN A DUAL-BEAM CHARGED PARTICLE...

CRYOGENIC SPECIMEN PROCESSING IN A CHARGED PARTICLE MICROSCOPE

ARRANGEMENT FOR X-RAY TOMOGRAPHY

METHOD OF MANIPULATING A SAMPLE IN AN EVACUATED CHAMBER OF A CHARGE...

METHOD OF MODIFYING A SAMPLE SURFACE LAYER FROM A MICROSCOPIC SAMPLE

SPECIMEN HOLDER FOR A CHARGED PARTICLE MICROSCOPE

METHOD OF ACQUIRING EBSP PATTERNS

Method of Sampling a Sample and Displaying Obtained Information