TomáTomá{hacek over (s)} Tůma

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Brno, CZ

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Patents Grantslast 30 patents

Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,971,372
- Issue date Apr 30, 2024
- FEI Company
- Jan Klusácek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for determining sample composition from spectral...
- Patent number 11,703,468
- Issue date Jul 18, 2023
- FEI Company
- Oleksii Kaplenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,519,871
- Issue date Dec 6, 2022
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,327,032
- Issue date May 10, 2022
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS