TomáTomá{hacek over (s)} Vystavel

Person

Brno, CZ

People

Patents Grantslast 30 patents

Information Patent Grant
Training an artificial neural network using simulated specimen images
- Patent number 12,002,194
- Issue date Jun 4, 2024
- FEI Company
- OndOnd{hacek over (r)}ej Machek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of examining a sample using a charged particle beam apparatus
- Patent number 11,815,479
- Issue date Nov 14, 2023
- FEI Company
- Oleksii Kaplenko
- G01 - MEASURING TESTING
Information Patent Grant
Method for diffraction pattern acquisition
- Patent number 11,499,926
- Issue date Nov 15, 2022
- FEI Company
- TomáTomá{hacek over (s)} Vystavel
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for dynamic band contrast imaging
- Patent number 11,195,693
- Issue date Dec 7, 2021
- FEI Company
- TomáTomá{hacek over (s)} Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manipulating a sample in an evacuated chamber of a charge...
- Patent number 11,017,980
- Issue date May 25, 2021
- FEI Company
- TomáTomá{hacek over (s)} Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Training an artificial neural network using simulated specimen images
- Patent number 10,846,845
- Issue date Nov 24, 2020
- FEI Company
- OndOnd{hacek over (r)}ej Machek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3D defect characterization of crystalline samples in a scanning typ...
- Patent number 10,784,076
- Issue date Sep 22, 2020
- FEI Company
- TomáTomá{hacek over (s)} Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for sample orientation for TEM lamella preparation
- Patent number 10,504,689
- Issue date Dec 10, 2019
- FEI Company
- TomáTomá{hacek over (s)} Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryogenic specimen processing in a charged particle microscope
- Patent number 10,170,275
- Issue date Jan 1, 2019
- FEI Company
- John Mitchels
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for X-Ray tomography
- Patent number 9,958,403
- Issue date May 1, 2018
- FEI Company
- Pavel Stejskal
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of sampling a sample and displaying obtained information
- Patent number 9,762,863
- Issue date Sep 12, 2017
- FEI Company
- Pavel Potocek
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of acquiring EBSP patterns
- Patent number 9,618,463
- Issue date Apr 11, 2017
- FEI Company
- Marek Uncovský
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TRAINING AN ARTIFICIAL NEURAL NETWORK USING SIMULATED SPECIMEN IMAGES
- Publication number 20210049749
- Publication date Feb 18, 2021
- FEI Company
- Ondrej Machek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D DEFECT CHARACTERIZATION OF CRYSTALLINE SAMPLES IN A SCANNING TYP...
- Publication number 20200013581
- Publication date Jan 9, 2020
- FEI Company
- TomáTomá{hacek over (s)} Vystavel
- H01 - BASIC ELECTRIC ELEMENTS

TomáTomá{hacek over (s)} Vystavel

Person

Patents Grantslast 30 patents

Training an artificial neural network using simulated specimen images

Method of examining a sample using a charged particle beam apparatus

Method for diffraction pattern acquisition

Method and system for dynamic band contrast imaging

Method of manipulating a sample in an evacuated chamber of a charge...

Training an artificial neural network using simulated specimen images

3D defect characterization of crystalline samples in a scanning typ...

Method for sample orientation for TEM lamella preparation

Cryogenic specimen processing in a charged particle microscope

Arrangement for X-Ray tomography

Method of sampling a sample and displaying obtained information

Method of acquiring EBSP patterns

Patents Applicationslast 30 patents

TRAINING AN ARTIFICIAL NEURAL NETWORK USING SIMULATED SPECIMEN IMAGES

3D DEFECT CHARACTERIZATION OF CRYSTALLINE SAMPLES IN A SCANNING TYP...