Tong Huang

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Alignment of a specimen for inspection and other processes
- Patent number 11,748,871
- Issue date Sep 5, 2023
- KLA Corp.
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deep learning networks for nuisance filtering
- Patent number 11,087,449
- Issue date Aug 10, 2021
- KLA Corp.
- Tong Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for identifying fabrica...
- Patent number 10,043,265
- Issue date Aug 7, 2018
- KLA-Tencor Corporation
- Tong Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single die inspection on a dark field inspection tool
- Patent number 9,008,410
- Issue date Apr 14, 2015
- KLA-Tencor Corporation
- Tong Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer-implemented methods and systems for classifying defects on...
- Patent number 8,532,949
- Issue date Sep 10, 2013
- KLA-Tencor Technologies Corp.
- Cho Huak Teh
- G01 - MEASURING TESTING
Information Patent Grant
Distance histogram for nearest neighbor defect classification
- Patent number 8,014,973
- Issue date Sep 6, 2011
- KLA-Tencor Corporation
- Tong Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for generating an inspection process for an ins...
- Patent number 7,570,797
- Issue date Aug 4, 2009
- KLA-Tencor Technologies Corp.
- David Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic supervised classifier setup tool for semiconductor defects
- Patent number 7,359,544
- Issue date Apr 15, 2008
- KLA-Tencor Technologies Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flexible hybrid defect classification for semiconductor manufacturing
- Patent number 7,142,992
- Issue date Nov 28, 2006
- KLA-Tencor Technologies Corp.
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Alignment of a Specimen for Inspection and Other Processes
- Publication number 20220101506
- Publication date Mar 31, 2022
- KLA Corporation
- Xuguang Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Deep Learning Networks for Nuisance Filtering
- Publication number 20210125325
- Publication date Apr 29, 2021
- KLA Corporation
- Tong Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR IDENTIFYING FABRICA...
- Publication number 20170270652
- Publication date Sep 21, 2017
- KLA-Tencor Corporation
- Tong Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Single Die Inspection on a Dark Field Inspection Tool
- Publication number 20140270475
- Publication date Sep 18, 2014
- KLA-Tencor Corporation
- Tong Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20060265145
- Publication date Nov 23, 2006
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Computer-implemented methods and systems for classifying defects on...
- Publication number 20060082763
- Publication date Apr 20, 2006
- Cho Huak Teh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automatic supervised classifier setup tool for semiconductor defects
- Publication number 20040156540
- Publication date Aug 12, 2004
- KLA-Tencor Technologies, Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Alignment of a specimen for inspection and other processes

Deep learning networks for nuisance filtering

System, method and computer program product for identifying fabrica...

Single die inspection on a dark field inspection tool

Computer-implemented methods and systems for classifying defects on...

Distance histogram for nearest neighbor defect classification

Methods and systems for generating an inspection process for an ins...

Automatic supervised classifier setup tool for semiconductor defects

Flexible hybrid defect classification for semiconductor manufacturing

Patents Applicationslast 30 patents

Alignment of a Specimen for Inspection and Other Processes

Deep Learning Networks for Nuisance Filtering

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR IDENTIFYING FABRICA...

Single Die Inspection on a Dark Field Inspection Tool

FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING

Computer-implemented methods and systems for classifying defects on...

Automatic supervised classifier setup tool for semiconductor defects