Tong Wu

Person

Taiwa-cho, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measuring device and optical fiber strain measuring jig thereof
- Patent number 12,196,629
- Issue date Jan 14, 2025
- Tokyo Electron Limited
- Tong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method and measurement system
- Patent number 11,906,466
- Issue date Feb 20, 2024
- Tokyo Electron Limited
- Takayuki Hatanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature measurement sensor, temperature measurement system, and...
- Patent number 11,841,278
- Issue date Dec 12, 2023
- Tokyo Electron Limited
- Tong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement system and temperature measurement method
- Patent number 11,668,608
- Issue date Jun 6, 2023
- Tokyo Electron Limited
- Tong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Reduced interference, real-time sensing of properties in manufactur...
- Patent number 11,646,210
- Issue date May 9, 2023
- Tokyo Electron Limited
- Tong Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antenna device and temperature detection method
- Patent number 11,460,355
- Issue date Oct 4, 2022
- Tokyo Electron Limited
- Tong Wu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
- Publication number 20240006165
- Publication date Jan 4, 2024
- TOKYO ELECTRON LIMITED
- Yoshihiro YANAGI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING JIG AND MEASURING DEVICE
- Publication number 20220244115
- Publication date Aug 4, 2022
- TOKYO ELECTRON LIMITED
- Tong WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT SYSTEM
- Publication number 20210262987
- Publication date Aug 26, 2021
- TOKYO ELECTRON LIMITED
- Takayuki HATANAKA
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT SYSTEM AND TEMPERATURE MEASUREMENT METHOD
- Publication number 20210102847
- Publication date Apr 8, 2021
- TOKYO ELECTRON LIMITED
- Tong Wu
- G01 - MEASURING TESTING
Information Patent Application
ANTENNA DEVICE AND TEMPERATURE DETECTION METHOD
- Publication number 20200408612
- Publication date Dec 31, 2020
- TOKYO ELECTRON LIMITED
- Tong WU
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT SENSOR, TEMPERATURE MEASUREMENT SYSTEM, AND...
- Publication number 20200408613
- Publication date Dec 31, 2020
- TOKYO ELECTRON LIMITED
- Tong WU
- G01 - MEASURING TESTING
Information Patent Application
REDUCED INTERFERENCE, REAL-TIME SENSING OF PROPERTIES IN MANUFACTUR...
- Publication number 20190385875
- Publication date Dec 19, 2019
- TOKYO ELECTRON LIMITED
- Tong Wu
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Measuring device and optical fiber strain measuring jig thereof

Measurement method and measurement system

Temperature measurement sensor, temperature measurement system, and...

Temperature measurement system and temperature measurement method

Reduced interference, real-time sensing of properties in manufactur...

Antenna device and temperature detection method

Patents Applicationslast 30 patents

PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

MEASURING JIG AND MEASURING DEVICE

MEASUREMENT METHOD AND MEASUREMENT SYSTEM

TEMPERATURE MEASUREMENT SYSTEM AND TEMPERATURE MEASUREMENT METHOD

ANTENNA DEVICE AND TEMPERATURE DETECTION METHOD

TEMPERATURE MEASUREMENT SENSOR, TEMPERATURE MEASUREMENT SYSTEM, AND...

REDUCED INTERFERENCE, REAL-TIME SENSING OF PROPERTIES IN MANUFACTUR...