Tonislav Ivanov

Person

Brooklyn, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Defect detection system
- Patent number 12,205,360
- Issue date Jan 21, 2025
- Nanotronics Imaging, Inc.
- Tonislav Ivanov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Autofocus system and method
- Patent number 12,140,744
- Issue date Nov 12, 2024
- Nanotronics Imaging, Inc.
- Patrick Schmidt
- G02 - OPTICS
Information Patent Grant
Deep learning model for noise reduction in low SNR imaging conditions
- Patent number 12,008,737
- Issue date Jun 11, 2024
- Nanotronics Imaging, Inc.
- Denis Sharoukhov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deep photometric learning (DPL) systems, apparatus and methods
- Patent number 11,574,413
- Issue date Feb 7, 2023
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection system
- Patent number 11,416,711
- Issue date Aug 16, 2022
- Nanotronics Imaging, Inc.
- Tonislav Ivanov
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOFOCUS SYSTEM AND METHOD
- Publication number 20240019678
- Publication date Jan 18, 2024
- Nanotronics Imaging, Inc.
- Patrick Schmidt
- G02 - OPTICS
Information Patent Application
Deep Photometric Learning (DPL) Systems, Apparatus and Methods
- Publication number 20230186502
- Publication date Jun 15, 2023
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Detection System
- Publication number 20220391641
- Publication date Dec 8, 2022
- Nanotronics Imaging, Inc.
- Tonislav Ivanov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Deep Learning Model for Noise Reduction in Low SNR Imaging Conditions
- Publication number 20220044362
- Publication date Feb 10, 2022
- Nanotronics Imaging, Inc.
- Denis Sharoukhov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Deep Learning Model for Auto-Focusing Microscope Systems
- Publication number 20220046180
- Publication date Feb 10, 2022
- Nanotronics Imaging, Inc.
- Denis Sharoukhov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Detection System
- Publication number 20210279520
- Publication date Sep 9, 2021
- Nanotronics Imaging, Inc.
- Tonislav Ivanov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Deep Photometric Learning (DPL) Systems, Apparatus and Methods
- Publication number 20210241478
- Publication date Aug 5, 2021
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G06 - COMPUTING CALCULATING COUNTING

Tonislav Ivanov

Person

Patents Grantslast 30 patents

Defect detection system

Autofocus system and method

Deep learning model for noise reduction in low SNR imaging conditions

Deep photometric learning (DPL) systems, apparatus and methods

Defect detection system

Patents Applicationslast 30 patents

AUTOFOCUS SYSTEM AND METHOD

Deep Photometric Learning (DPL) Systems, Apparatus and Methods

Defect Detection System

Deep Learning Model for Noise Reduction in Low SNR Imaging Conditions

Deep Learning Model for Auto-Focusing Microscope Systems

Defect Detection System

Deep Photometric Learning (DPL) Systems, Apparatus and Methods