Tony Davis

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
System to detect wafer arcing in semiconductor manufacturing equipment
- Patent number 10,283,421
- Issue date May 7, 2019
- Applied Materials, Inc.
- Scott Singlevich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to detect wafer arcing in semiconductor manufacturing equipment
- Patent number 9,508,612
- Issue date Nov 29, 2016
- Applied Materials, Inc.
- Scott Singlevich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predictive maintenance for third party support equipment
- Patent number 8,560,106
- Issue date Oct 15, 2013
- Applied Materials, Inc.
- John R. Swyers
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for analyzing manufacturing data
- Patent number 6,965,895
- Issue date Nov 15, 2005
- Applied Materials, Inc.
- Shawn B. Smith
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM TO DETECT WAFER ARCING IN SEMICONDUCTOR MANUFACTURING EQUIPMENT
- Publication number 20170077002
- Publication date Mar 16, 2017
- Applied Materials, Inc.
- Scott Singlevich
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO DETECT WAFER ARCING IN SEMICONDUCTOR MANUFACTURING EQUIPMENT
- Publication number 20130245969
- Publication date Sep 19, 2013
- Applied Materials, Inc.
- Scott Singlevich
- G01 - MEASURING TESTING
Information Patent Application
PREDICTIVE MAINTENANCE FOR THIRD PARTY SUPPORT EQUIPMENT
- Publication number 20120191225
- Publication date Jul 26, 2012
- John R. Swyers
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for analyzing manufacturing data
- Publication number 20030061212
- Publication date Mar 27, 2003
- APPLIED MATERIALS, INC.
- Shawn B. Smith
- G06 - COMPUTING CALCULATING COUNTING