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Torsten Antrack
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Berlin, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Multi-way prism
Patent number
10,877,286
Issue date
Dec 29, 2020
Cad Zeiss Jena GmbH
Mario Sondermann
G02 - OPTICS
Information
Patent Grant
Optical near-field microscope
Patent number
6,674,057
Issue date
Jan 6, 2004
Carl Zeiss Jena GmbH
Winfried Wiegraebe
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope with probe integrated in an optical system
Patent number
6,545,263
Issue date
Apr 8, 2003
Carl Zeiss Jena GmbH
Ralph Lange
G01 - MEASURING TESTING
Information
Patent Grant
Probe element for coordinate measurement systems
Patent number
5,524,354
Issue date
Jun 11, 1996
Carl Zeiss Jena GmbH
Karlheinz Bartzke
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MULTIPLE WAY PRISM FOR B4-STANDARD
Publication number
20210132402
Publication date
May 6, 2021
SUPPONOR HOLDING LIMITED
Mario SONDERMANN
G02 - OPTICS
Information
Patent Application
MULTI-WAY PRISM
Publication number
20190162976
Publication date
May 30, 2019
Carl Zeiss Jena GmbH
Mario SONDERMANN
G02 - OPTICS
Information
Patent Application
SCANNING PROBE MICROSCOPE WITH PROBE INTEGRATED IN AN OPTICAL SYSTEM
Publication number
20020139923
Publication date
Oct 3, 2002
RALPH LANGE
B82 - NANO-TECHNOLOGY