Torsten Jahnke

Person

Lychen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Measuring device for a scanning probe microscope, scanning probe mi...
- Patent number 10,539,591
- Issue date Jan 21, 2020
- Bruker Nano GmbH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and a method for investigating a sample by means of sever...
- Patent number 9,080,937
- Issue date Jul 14, 2015
- JPK Instruments AG
- Gerd Behme
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the combined analysis of a sample with obj...
- Patent number 8,898,809
- Issue date Nov 25, 2014
- JPK Instruments AG
- Torsten Müller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for examining a measurement object, and apparatus
- Patent number 8,769,711
- Issue date Jul 1, 2014
- JPK Instruments AG
- Torsten Jähnke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measuring probe device for a probe microscope, measuring cell and s...
- Patent number 8,505,109
- Issue date Aug 6, 2013
- JPK Instruments AG
- Torsten Jähnke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for examining a test sample using a scanning probe microscop...
- Patent number 8,381,311
- Issue date Feb 19, 2013
- JPK Instruments AG
- Torsten Jähnke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for the operation of a measurement system with a scanning pr...
- Patent number 8,368,017
- Issue date Feb 5, 2013
- JPK Instruments AG
- Torsten Jahnke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for providing a probe for a probe-microscopic analysis of a...
- Patent number 7,971,266
- Issue date Jun 28, 2011
- JPK Instruments AG
- Torsten Jähnke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and a device for the positioning of a displaceable component...
- Patent number 7,934,323
- Issue date May 3, 2011
- JPK Instruments AG
- Detlef Knebel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 7,473,894
- Issue date Jan 6, 2009
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 7,022,985
- Issue date Apr 4, 2006
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Arrangement Having a Measuring Apparatus for a Scanning Probe Micro...
- Publication number 20220244287
- Publication date Aug 4, 2022
- BRUKER NANO GMBH
- Torsten Jahnke
- G01 - MEASURING TESTING
Information Patent Application
Measuring Device for a Scanning Probe Microscope, Scanning Probe Mi...
- Publication number 20190170789
- Publication date Jun 6, 2019
- BRUKER NANO GMBH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND A METHOD FOR INVESTIGATING A SAMPLE BY MEANS OF SEVER...
- Publication number 20140016119
- Publication date Jan 16, 2014
- GERD BEHME
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR THE COMBINED ANALYSIS OF A SAMPLE WITH OBJ...
- Publication number 20100263098
- Publication date Oct 14, 2010
- Torsten Müller
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE DEVICE FOR A PROBE MICROSCOPE, MEASURING CELL AND S...
- Publication number 20100263096
- Publication date Oct 14, 2010
- Torsten Jähnke
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD FOR EXAMINING A TEST SAMPLE USING A SCANNING PROBE MICRSCOPE...
- Publication number 20100218284
- Publication date Aug 26, 2010
- JPK INSTRUMENTS AG
- Torsten Jahnke
- G01 - MEASURING TESTING
Information Patent Application
Heat Coupling Device
- Publication number 20100031403
- Publication date Feb 4, 2010
- NAMBITION GMBH
- Mirko Leuschner
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
Method for providing a probe for a probe-microscopic analysis of a...
- Publication number 20090300807
- Publication date Dec 3, 2009
- Torsten Jähnke
- G01 - MEASURING TESTING
Information Patent Application
Method for Examining a Measurement Object, and Apparatus
- Publication number 20090205089
- Publication date Aug 13, 2009
- Torsten Jähnke
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Positioning a Movable Part in a Test System
- Publication number 20090140685
- Publication date Jun 4, 2009
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
Method for the Operation of a Measurement System With a Scanning Pr...
- Publication number 20080308726
- Publication date Dec 18, 2008
- Torsten Jahnke
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for a scanning probe microscope
- Publication number 20060168703
- Publication date Jul 27, 2006
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for a scanning probe microscope
- Publication number 20050061970
- Publication date Mar 24, 2005
- Detlef Knebel
- G01 - MEASURING TESTING

Torsten Jahnke

Person

Patents Grantslast 30 patents

Measuring device for a scanning probe microscope, scanning probe mi...

Apparatus and a method for investigating a sample by means of sever...

Method and apparatus for the combined analysis of a sample with obj...

Method for examining a measurement object, and apparatus

Measuring probe device for a probe microscope, measuring cell and s...

Method for examining a test sample using a scanning probe microscop...

Method for the operation of a measurement system with a scanning pr...

Method for providing a probe for a probe-microscopic analysis of a...

Method and a device for the positioning of a displaceable component...

Apparatus and method for a scanning probe microscope

Apparatus and method for a scanning probe microscope

Patents Applicationslast 30 patents

Arrangement Having a Measuring Apparatus for a Scanning Probe Micro...

Measuring Device for a Scanning Probe Microscope, Scanning Probe Mi...

APPARATUS AND A METHOD FOR INVESTIGATING A SAMPLE BY MEANS OF SEVER...

METHOD AND APPARATUS FOR THE COMBINED ANALYSIS OF A SAMPLE WITH OBJ...

MEASURING PROBE DEVICE FOR A PROBE MICROSCOPE, MEASURING CELL AND S...

METHOD FOR EXAMINING A TEST SAMPLE USING A SCANNING PROBE MICRSCOPE...

Heat Coupling Device

Method for providing a probe for a probe-microscopic analysis of a...

Method for Examining a Measurement Object, and Apparatus

Method and Device for Positioning a Movable Part in a Test System

Method for the Operation of a Measurement System With a Scanning Pr...

Apparatus and method for a scanning probe microscope

Apparatus and method for a scanning probe microscope