Torsten Seidel

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for exposing a semiconductor wafer
- Patent number 6,887,722
- Issue date May 3, 2005
- Infineon Technologies SC300 GmbH & Co. KG
- Thorsten Schedel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for adjusting a temperature in a resist process
- Patent number 6,806,008
- Issue date Oct 19, 2004
- Infineon Technologies SC300 GmbH & Co. KG
- Thorsten Schedel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Configuration and method for detecting defects on a substrate in a...
- Publication number 20040117055
- Publication date Jun 17, 2004
- Torsten Seidel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for exposing a semiconductor wafer
- Publication number 20040029027
- Publication date Feb 12, 2004
- Thorsten Schedel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for adjusting a temperature in a resist process
- Publication number 20030008242
- Publication date Jan 9, 2003
- Thorsten Schedel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY