Torsten SIEVERS

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Heidenheim an der Brenz, DE

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Patents Grantslast 30 patents

Information Patent Grant
Microscopic examination of an object using a sequence of optical mi...
- Patent number 11,454,797
- Issue date Sep 27, 2022
- Carl Zeiss Microscopy GmbH
- Christian Thomas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopic examination of an object using a sequence of optical mi...
- Patent number 10,473,907
- Issue date Nov 12, 2019
- Carl Zeiss Microscopy GmbH
- Christian Thomas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopic examination of an object using a sequence of optical mi...
- Patent number 9,581,799
- Issue date Feb 28, 2017
- Carl Zeiss AG
- Christian Thomas
- G02 - OPTICS
Information Patent Grant
Microscopy of several samples using optical microscopy and particle...
- Patent number 8,837,795
- Issue date Sep 16, 2014
- Carl Zeiss Microscopy GmbH
- Torsten Sievers
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MICROSCOPIC EXAMINATION OF AN OBJECT USING A SEQUENCE OF OPTICAL MI...
- Publication number 20200041779
- Publication date Feb 6, 2020
- CARL ZEISS MICROSCOPY GMBH
- Christian THOMAS
- G02 - OPTICS
Information Patent Application
MICROSCOPIC EXAMINATION OF AN OBJECT USING A SEQUENCE OF OPTICAL MI...
- Publication number 20170160532
- Publication date Jun 8, 2017
- Carl-Zeiss AG
- Christian Thomas
- G02 - OPTICS
Information Patent Application
MICROSCOPY OF SEVERAL SAMPLES USING OPTICAL MICROSCOPY AND PARTICLE...
- Publication number 20130101188
- Publication date Apr 25, 2013
- CARL ZEISS MICROSCOPY GMBH
- Torsten SIEVERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPIC EXAMINATION OF AN OBJECT USING A SEQUENCE OF OPTICAL MI...
- Publication number 20120133757
- Publication date May 31, 2012
- Carl-Zeiss AG
- Christian Thomas
- G02 - OPTICS