Toru Chonan

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory device test circuit having an improved compare...
- Patent number 5,777,932
- Issue date Jul 7, 1998
- NEC Corporation
- Toru Chonan
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit detecting electric potential of semiconductor substrate by...
- Patent number 5,668,487
- Issue date Sep 16, 1997
- NEC Corporation
- Toru Chonan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic memory device having a plurality of internal power sources
- Patent number 5,463,588
- Issue date Oct 31, 1995
- NEC Corporation
- Toru Chonan
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor memory device
- Publication number 20010005325
- Publication date Jun 28, 2001
- NEC Corporation
- Makoto Kitayama
- G11 - INFORMATION STORAGE